FR2958399B1 - Surveillance d'un systeme par reflectometrie optique - Google Patents

Surveillance d'un systeme par reflectometrie optique

Info

Publication number
FR2958399B1
FR2958399B1 FR1052385A FR1052385A FR2958399B1 FR 2958399 B1 FR2958399 B1 FR 2958399B1 FR 1052385 A FR1052385 A FR 1052385A FR 1052385 A FR1052385 A FR 1052385A FR 2958399 B1 FR2958399 B1 FR 2958399B1
Authority
FR
France
Prior art keywords
monitoring
optical reflectometry
reflectometry
optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR1052385A
Other languages
English (en)
Other versions
FR2958399A1 (fr
Inventor
Christian Dorize
Gabriel Charlet
Patrice Tran
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Alcatel Lucent SAS
Original Assignee
Alcatel Lucent SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to FR1052385A priority Critical patent/FR2958399B1/fr
Application filed by Alcatel Lucent SAS filed Critical Alcatel Lucent SAS
Priority to KR1020127025394A priority patent/KR101470299B1/ko
Priority to PCT/EP2011/054017 priority patent/WO2011120813A1/fr
Priority to US13/580,302 priority patent/US20130038879A1/en
Priority to CN201180017202.1A priority patent/CN102834705B/zh
Priority to JP2013501736A priority patent/JP5731631B2/ja
Priority to EP11708483A priority patent/EP2553417A1/fr
Priority to TW100110109A priority patent/TWI482954B/zh
Publication of FR2958399A1 publication Critical patent/FR2958399A1/fr
Application granted granted Critical
Publication of FR2958399B1 publication Critical patent/FR2958399B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G01M11/3109—Reflectometers detecting the back-scattered light in the time-domain, e.g. OTDR
    • G01M11/3127—Reflectometers detecting the back-scattered light in the time-domain, e.g. OTDR using multiple or wavelength variable input source
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G01M11/3109—Reflectometers detecting the back-scattered light in the time-domain, e.g. OTDR
    • G01M11/3118—Reflectometers detecting the back-scattered light in the time-domain, e.g. OTDR using coded light-pulse sequences
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
    • H04B10/071—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using a reflected signal, e.g. using optical time domain reflectometers [OTDR]
FR1052385A 2010-03-31 2010-03-31 Surveillance d'un systeme par reflectometrie optique Active FR2958399B1 (fr)

Priority Applications (8)

Application Number Priority Date Filing Date Title
FR1052385A FR2958399B1 (fr) 2010-03-31 2010-03-31 Surveillance d'un systeme par reflectometrie optique
PCT/EP2011/054017 WO2011120813A1 (fr) 2010-03-31 2011-03-17 Contrôle d'un système à l'aide d'une réflectométrie optique
US13/580,302 US20130038879A1 (en) 2010-03-31 2011-03-17 Monitoring a system using optical reflectometry
CN201180017202.1A CN102834705B (zh) 2010-03-31 2011-03-17 使用光学反射计监视系统
KR1020127025394A KR101470299B1 (ko) 2010-03-31 2011-03-17 광학 반사 측정법을 이용한 시스템 감시
JP2013501736A JP5731631B2 (ja) 2010-03-31 2011-03-17 光リフレクトメトリを用いたシステムの監視
EP11708483A EP2553417A1 (fr) 2010-03-31 2011-03-17 Contrôle d'un système à l'aide d'une réflectométrie optique
TW100110109A TWI482954B (zh) 2010-03-31 2011-03-24 光反射測量術監測設備

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR1052385A FR2958399B1 (fr) 2010-03-31 2010-03-31 Surveillance d'un systeme par reflectometrie optique

Publications (2)

Publication Number Publication Date
FR2958399A1 FR2958399A1 (fr) 2011-10-07
FR2958399B1 true FR2958399B1 (fr) 2012-05-04

Family

ID=43015815

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1052385A Active FR2958399B1 (fr) 2010-03-31 2010-03-31 Surveillance d'un systeme par reflectometrie optique

Country Status (8)

Country Link
US (1) US20130038879A1 (fr)
EP (1) EP2553417A1 (fr)
JP (1) JP5731631B2 (fr)
KR (1) KR101470299B1 (fr)
CN (1) CN102834705B (fr)
FR (1) FR2958399B1 (fr)
TW (1) TWI482954B (fr)
WO (1) WO2011120813A1 (fr)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102761363B (zh) * 2011-04-27 2016-03-30 华为海洋网络有限公司 一种光时域反射仪信号检测方法及装置
GB2544125A (en) * 2016-02-09 2017-05-10 Xtera Communications Ltd Optical time domain reflectometry
US10211920B1 (en) * 2017-09-07 2019-02-19 Amazon Technologies, Inc. Latency based chromatic dispersion estimation methods
JP6966039B2 (ja) * 2017-10-25 2021-11-10 住友電工デバイス・イノベーション株式会社 試験装置
JP7230544B2 (ja) * 2019-02-01 2023-03-01 日本電信電話株式会社 光ファイバルート探索方法、及び光ファイバルート探索装置
US11391622B2 (en) * 2019-02-06 2022-07-19 Nec Corporation Optical fiber sensing system with reduced spatial resolution and noise for multiple application uses
US10996138B2 (en) * 2019-08-30 2021-05-04 Viavi Solutions Inc. Parallel optics based optical time domain reflectometer acquisition

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2672988B2 (ja) * 1988-11-16 1997-11-05 日本電信電話株式会社 光ファイバにおける後方散乱光の処理方法
JPH04132932A (ja) * 1990-09-26 1992-05-07 Yokogawa Electric Corp 自己相関型光ファイバ障害点位置検査機
FR2718587B1 (fr) * 1994-04-11 1996-05-03 France Telecom Système d'émission-réception optique à réflectométrie.
GB9524485D0 (en) 1995-11-30 1996-01-31 Bicc Plc Device for interrogating an optical fibre network
GB9604322D0 (en) * 1996-02-29 1996-05-01 Stc Submarine Systems Ltd EOTDR three wavelength signalling
US6014237A (en) * 1998-06-01 2000-01-11 Sarnoff Corporation Multiwavelength mode-locked dense wavelength division multiplexed optical communication systems
FR2817960B1 (fr) * 2000-12-13 2003-04-04 Acome Soc Coop Travailleurs Reflectometre a plusieurs longueurs d'ondes
WO2003060456A1 (fr) * 2002-01-16 2003-07-24 Agilent Technologies, Inc. Methode de retrodiffusion a signaux stimulus appliques simultanement
US6750973B2 (en) * 2002-02-20 2004-06-15 Agilent Technologies, Inc. Test structure for simultaneously characterizing two ports of an optical component using interferometer-based optical network analysis
JP3686390B2 (ja) * 2002-05-15 2005-08-24 アンリツ株式会社 光ファイバ測定装置
FR2844051B1 (fr) * 2002-08-30 2004-11-12 Nexans Systeme pour le controle par reflectometrie dans le domaine temporel (otdr) d'un reseau optique
CN2708291Y (zh) * 2004-04-01 2005-07-06 捷耀光通讯股份有限公司 具有辅助供电的usb光时域反射测试（otdr）装置
KR100609697B1 (ko) * 2004-06-02 2006-08-08 한국전자통신연구원 이득 고정형 광증폭기를 이용한 광 선로 감시 시스템
TW200643472A (en) * 2005-04-07 2006-12-16 Accent Optical Tech Inc Apparatus and methods for scatterometry of optical devices
EP1746403A1 (fr) * 2005-07-19 2007-01-24 Agilent Technologies, Inc. Analyse de réflectrométrie optique avec ajustement du temps des réponses partielles
TWI437225B (zh) * 2006-04-27 2014-05-11 Jordan Valley Semiconductors 使用光學度量衡設備之污染監視及控制技術
US7872737B2 (en) * 2007-07-27 2011-01-18 Tyco Electronics Subsea Communications Llc System and method for optical time domain reflectometry using multi-resolution code sequences
CN101217313A (zh) * 2008-01-11 2008-07-09 北京邮电大学 一种使用otdr的无源光网络光纤故障诊断方法

Also Published As

Publication number Publication date
FR2958399A1 (fr) 2011-10-07
CN102834705B (zh) 2016-01-20
CN102834705A (zh) 2012-12-19
US20130038879A1 (en) 2013-02-14
JP5731631B2 (ja) 2015-06-10
KR20120135292A (ko) 2012-12-12
KR101470299B1 (ko) 2014-12-08
JP2013524183A (ja) 2013-06-17
WO2011120813A1 (fr) 2011-10-06
TWI482954B (zh) 2015-05-01
EP2553417A1 (fr) 2013-02-06
TW201207365A (en) 2012-02-16

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Legal Events

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GC Lien (pledge) constituted

Effective date: 20131018

RG Lien (pledge) cancelled

Effective date: 20141016

CA Change of address

Effective date: 20150521

CA Change of address

Effective date: 20150521

PLFP Fee payment

Year of fee payment: 7

PLFP Fee payment

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