FR2930372B1 - Element et module optique imageur pour composant semi-conducteur optique, procede pour le traitement d'un element optique imageur et appareil de captation d'images - Google Patents

Element et module optique imageur pour composant semi-conducteur optique, procede pour le traitement d'un element optique imageur et appareil de captation d'images

Info

Publication number
FR2930372B1
FR2930372B1 FR0852650A FR0852650A FR2930372B1 FR 2930372 B1 FR2930372 B1 FR 2930372B1 FR 0852650 A FR0852650 A FR 0852650A FR 0852650 A FR0852650 A FR 0852650A FR 2930372 B1 FR2930372 B1 FR 2930372B1
Authority
FR
France
Prior art keywords
imageur
optical element
module
optical
processing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0852650A
Other languages
English (en)
Other versions
FR2930372A1 (fr
Inventor
Blanc Emmanuelle Vigier
Guillaume Cassar
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SA
Original Assignee
STMicroelectronics SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics SA filed Critical STMicroelectronics SA
Priority to FR0852650A priority Critical patent/FR2930372B1/fr
Priority to US12/937,971 priority patent/US8654446B2/en
Priority to PCT/EP2009/054211 priority patent/WO2009127571A1/fr
Priority to CN2009801135535A priority patent/CN102037382A/zh
Priority to JP2011504424A priority patent/JP2011517788A/ja
Priority to EP09732395A priority patent/EP2274642A1/fr
Publication of FR2930372A1 publication Critical patent/FR2930372A1/fr
Application granted granted Critical
Publication of FR2930372B1 publication Critical patent/FR2930372B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B3/00—Simple or compound lenses
    • G02B3/0087—Simple or compound lenses with index gradient
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14618—Containers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14683—Processes or apparatus peculiar to the manufacture or treatment of these devices or parts thereof
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14625—Optical elements or arrangements associated with the device
    • H01L27/14627—Microlenses
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Optics & Photonics (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Lens Barrels (AREA)
FR0852650A 2008-04-18 2008-04-18 Element et module optique imageur pour composant semi-conducteur optique, procede pour le traitement d'un element optique imageur et appareil de captation d'images Expired - Fee Related FR2930372B1 (fr)

Priority Applications (6)

Application Number Priority Date Filing Date Title
FR0852650A FR2930372B1 (fr) 2008-04-18 2008-04-18 Element et module optique imageur pour composant semi-conducteur optique, procede pour le traitement d'un element optique imageur et appareil de captation d'images
US12/937,971 US8654446B2 (en) 2008-04-18 2009-04-08 Optical imaging element and module for an optical semiconductor component, method for processing an optical imaging element and image capture apparatus
PCT/EP2009/054211 WO2009127571A1 (fr) 2008-04-18 2009-04-08 Élément et module d'imagerie optique pour un composant à semi-conducteurs optique, procédé de traitement d'un élément d'imagerie optique et appareil de capture d'image
CN2009801135535A CN102037382A (zh) 2008-04-18 2009-04-08 用于光学半导体组件的光学成像元件和模块、用于处理光学成像元件的方法以及图像捕获装置
JP2011504424A JP2011517788A (ja) 2008-04-18 2009-04-08 光学半導体コンポ―ネントのための光学撮像素子及びモジュール、光学撮像素子のための処理方法、及び、画像取込装置
EP09732395A EP2274642A1 (fr) 2008-04-18 2009-04-08 Élément et module d'imagerie optique pour un composant à semi-conducteurs optique, procédé de traitement d'un élément d'imagerie optique et appareil de capture d'image

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0852650A FR2930372B1 (fr) 2008-04-18 2008-04-18 Element et module optique imageur pour composant semi-conducteur optique, procede pour le traitement d'un element optique imageur et appareil de captation d'images

Publications (2)

Publication Number Publication Date
FR2930372A1 FR2930372A1 (fr) 2009-10-23
FR2930372B1 true FR2930372B1 (fr) 2011-05-27

Family

ID=39952251

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0852650A Expired - Fee Related FR2930372B1 (fr) 2008-04-18 2008-04-18 Element et module optique imageur pour composant semi-conducteur optique, procede pour le traitement d'un element optique imageur et appareil de captation d'images

Country Status (6)

Country Link
US (1) US8654446B2 (fr)
EP (1) EP2274642A1 (fr)
JP (1) JP2011517788A (fr)
CN (1) CN102037382A (fr)
FR (1) FR2930372B1 (fr)
WO (1) WO2009127571A1 (fr)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201414992A (zh) * 2012-07-17 2014-04-16 Heptagon Micro Optics Pte Ltd 精巧型光譜計模組及其製造方法
TW201419505A (zh) * 2012-07-17 2014-05-16 Heptagon Micro Optics Pte Ltd 精巧型光電模組及其製造方法
TWI707483B (zh) * 2012-07-17 2020-10-11 新加坡商新加坡恒立私人有限公司 發射可變強度分布的光線的光電模組
USD737822S1 (en) * 2014-03-10 2015-09-01 Datalogic Ip Tech S.R.L. Optical module
USD805078S1 (en) * 2015-05-07 2017-12-12 Datalogic Ip Tech S.R.L. Barcode reading module

Family Cites Families (27)

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US3823995A (en) * 1972-03-30 1974-07-16 Corning Glass Works Method of forming light focusing fiber waveguide
US3859103A (en) * 1973-03-08 1975-01-07 Nippon Selfoc Co Ltd Optical glass body having a refractive index gradient
US4268112A (en) * 1977-05-18 1981-05-19 International Telephone And Telegraph Corporation Fiber optic connector using gradient index lenses
US4639094A (en) * 1982-10-04 1987-01-27 Nippon Kogaku K. K. Gradient index lens system
US4805997A (en) * 1985-05-31 1989-02-21 Hoya Corporation Gradient refractive index type anamorphic planar microlens and method of producing the same
US4761062A (en) * 1986-10-27 1988-08-02 Xerox Corporation Gradient index lens array with improved image quality due to stray light reduction
JP3105522B2 (ja) * 1990-06-20 2000-11-06 オリンパス光学工業株式会社 屈折率分布型光学素子の製造方法
US5062688A (en) * 1990-09-14 1991-11-05 Nippon Sheet Glass Co., Ltd. Flat plate optical element and method for preparing the same
US5136428A (en) * 1991-06-03 1992-08-04 At&T Bell Laboratories Flat-plate optical device having a gradient index of refraction for correcting spatial distortions
JP3206997B2 (ja) * 1992-11-13 2001-09-10 オリンパス光学工業株式会社 屈折率分布型シリケートガラス
US5585968A (en) * 1993-12-01 1996-12-17 International Business Machines Corporation Optical elements having regions of different indices of refraction and method of fabricating the same
US5870638A (en) * 1996-09-03 1999-02-09 Asahi Kogaku Kogyo Kabushiki Kaisha Camera having two operative modes
KR100359768B1 (ko) * 1999-03-18 2002-11-07 주식회사 하이닉스반도체 고체 촬상 소자 및 그 제조방법
AU2001245287A1 (en) * 2000-02-17 2001-09-12 Aleph Lightgale Corporation Fiber-ring optical resonators
JP4107800B2 (ja) * 2000-11-15 2008-06-25 株式会社リコー 平板状レンズの製造方法
US7414661B2 (en) * 2002-08-13 2008-08-19 Micron Technology, Inc. CMOS image sensor using gradient index chip scale lenses
EP1424570A1 (fr) 2002-11-28 2004-06-02 Avanex Corporation Dispositif à focalisation
JPWO2005076361A1 (ja) * 2004-02-03 2007-08-02 松下電器産業株式会社 固体撮像装置、その製造方法およびカメラ
KR100672680B1 (ko) * 2004-08-11 2007-01-22 동부일렉트로닉스 주식회사 씨모스 이미지 센서 및 그의 제조 방법
WO2006025496A1 (fr) * 2004-09-01 2006-03-09 Matsushita Electric Industrial Co., Ltd. Élément condensateur, dispositif de mise en image à corps solide et procédé de fabrication
JP2006106324A (ja) * 2004-10-05 2006-04-20 Nippon Sheet Glass Co Ltd 屈折率分布型ロッドレンズ、およびその製造方法
CN1862289A (zh) * 2005-05-13 2006-11-15 鸿富锦精密工业（深圳）有限公司 梯度折射率透镜及其制备方法
JP4091948B2 (ja) * 2005-06-17 2008-05-28 松下電器産業株式会社 集光装置およびそれを用いた密着型固体撮像装置
JP4492533B2 (ja) * 2005-12-27 2010-06-30 船井電機株式会社 複眼撮像装置
EP1944808A1 (fr) * 2007-01-15 2008-07-16 Stmicroelectronics Sa Module optique imageur destiné à être associé à un composant semi-conducteur optique et procédé pour sa fabrication.
US8411375B2 (en) * 2008-01-25 2013-04-02 Aptina Imaging Corporation Method and apparatus providing gradient index of refraction lens for image sensors
FR2933500B1 (fr) * 2008-07-02 2010-09-10 St Microelectronics Grenoble Pastille optique a indice de refraction variable, adaptatrice d'angle d'incidence, et procede de fabrication d'une telle pastille

Also Published As

Publication number Publication date
EP2274642A1 (fr) 2011-01-19
US8654446B2 (en) 2014-02-18
WO2009127571A1 (fr) 2009-10-22
JP2011517788A (ja) 2011-06-16
CN102037382A (zh) 2011-04-27
FR2930372A1 (fr) 2009-10-23
US20110134304A1 (en) 2011-06-09

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Effective date: 20131231