FR2910637B1 - INDUCTION HEATING FOR CONNECTOR TESTING - Google Patents

INDUCTION HEATING FOR CONNECTOR TESTING

Info

Publication number
FR2910637B1
FR2910637B1 FR0655905A FR0655905A FR2910637B1 FR 2910637 B1 FR2910637 B1 FR 2910637B1 FR 0655905 A FR0655905 A FR 0655905A FR 0655905 A FR0655905 A FR 0655905A FR 2910637 B1 FR2910637 B1 FR 2910637B1
Authority
FR
France
Prior art keywords
induction heating
connector testing
testing
connector
induction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0655905A
Other languages
French (fr)
Other versions
FR2910637A1 (en
Inventor
Philippe Burguburu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
PSA Automobiles SA
Original Assignee
Peugeot Citroen Automobiles SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Peugeot Citroen Automobiles SA filed Critical Peugeot Citroen Automobiles SA
Priority to FR0655905A priority Critical patent/FR2910637B1/en
Publication of FR2910637A1 publication Critical patent/FR2910637A1/en
Application granted granted Critical
Publication of FR2910637B1 publication Critical patent/FR2910637B1/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836Fault-finding or characterising
    • G01R31/2849Environmental or reliability testing, e.g. burn-in or validation tests
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66Testing of connections, e.g. of plugs or non-disconnectable joints
    • G01R31/68Testing of releasable connections, e.g. of terminals mounted on a printed circuit board
    • G01R31/69Testing of releasable connections, e.g. of terminals mounted on a printed circuit board of terminals at the end of a cable or a wire harness; of plugs; of sockets, e.g. wall sockets or power sockets in appliances
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2855Environmental, reliability or burn-in testing
    • G01R31/2872Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2874Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature
    • G01R31/2875Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature related to heating

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Connector Housings Or Holding Contact Members (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
FR0655905A 2006-12-22 2006-12-22 INDUCTION HEATING FOR CONNECTOR TESTING Expired - Fee Related FR2910637B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR0655905A FR2910637B1 (en) 2006-12-22 2006-12-22 INDUCTION HEATING FOR CONNECTOR TESTING

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0655905A FR2910637B1 (en) 2006-12-22 2006-12-22 INDUCTION HEATING FOR CONNECTOR TESTING

Publications (2)

Publication Number Publication Date
FR2910637A1 FR2910637A1 (en) 2008-06-27
FR2910637B1 true FR2910637B1 (en) 2009-01-23

Family

ID=38326322

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0655905A Expired - Fee Related FR2910637B1 (en) 2006-12-22 2006-12-22 INDUCTION HEATING FOR CONNECTOR TESTING

Country Status (1)

Country Link
FR (1) FR2910637B1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113933624B (en) * 2021-09-28 2023-03-28 安徽三竹智能科技股份有限公司 Quality detection platform based on multi-model industrial connector

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04265870A (en) * 1991-02-21 1992-09-22 Mitsubishi Electric Corp Thermal stress evaluation method for semiconductor device
US5519193A (en) * 1992-10-27 1996-05-21 International Business Machines Corporation Method and apparatus for stressing, burning in and reducing leakage current of electronic devices using microwave radiation
US6113262A (en) * 1999-01-22 2000-09-05 Trw Inc. Apparatus for testing electrical components

Also Published As

Publication number Publication date
FR2910637A1 (en) 2008-06-27

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20120831