FR2892511B1 - HETERODYNE OPTICAL SAMPLING DEVICE - Google Patents

HETERODYNE OPTICAL SAMPLING DEVICE

Info

Publication number
FR2892511B1
FR2892511B1 FR0510776A FR0510776A FR2892511B1 FR 2892511 B1 FR2892511 B1 FR 2892511B1 FR 0510776 A FR0510776 A FR 0510776A FR 0510776 A FR0510776 A FR 0510776A FR 2892511 B1 FR2892511 B1 FR 2892511B1
Authority
FR
France
Prior art keywords
signal
sampling device
probe beam
pulses
pump beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR0510776A
Other languages
French (fr)
Other versions
FR2892511A1 (en
Inventor
Stefan Dilhaire
Wilfrid Claeys
Jean Michel Rampnoux
Clement Rossignol
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre National de la Recherche Scientifique CNRS
Original Assignee
Centre National de la Recherche Scientifique CNRS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to FR0510776A priority Critical patent/FR2892511B1/en
Application filed by Centre National de la Recherche Scientifique CNRS filed Critical Centre National de la Recherche Scientifique CNRS
Priority to AT06831000T priority patent/ATE425445T1/en
Priority to DE602006005708T priority patent/DE602006005708D1/en
Priority to PCT/FR2006/002384 priority patent/WO2007045773A1/en
Priority to EP06831000A priority patent/EP1949055B1/en
Priority to US12/090,893 priority patent/US7728317B2/en
Priority to JP2008536087A priority patent/JP4897821B2/en
Publication of FR2892511A1 publication Critical patent/FR2892511A1/en
Application granted granted Critical
Publication of FR2892511B1 publication Critical patent/FR2892511B1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J11/00—Measuring the characteristics of individual optical pulses or of optical pulse trains
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G—PHYSICS
    • G04—HOROLOGY
    • G04F—TIME-INTERVAL MEASURING
    • G04F13/00—Apparatus for measuring unknown time intervals by means not provided for in groups G04F5/00 - G04F10/00
    • G04F13/02—Apparatus for measuring unknown time intervals by means not provided for in groups G04F5/00 - G04F10/00 using optical means
    • G04F13/026—Measuring duration of ultra-short light pulses, e.g. in the pico-second range; particular detecting devices therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/04—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by beating two waves of a same source but of different frequency and measuring the phase shift of the lower frequency obtained
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/1734—Sequential different kinds of measurements; Combining two or more methods
    • G01N2021/1736—Sequential different kinds of measurements; Combining two or more methods with two or more light sources
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/1789—Time resolved
    • G01N2021/1791—Time resolved stroboscopic; pulse gated; time range gated
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
    • H01S3/13—Stabilisation of laser output parameters, e.g. frequency or amplitude
    • H01S3/139—Stabilisation of laser output parameters, e.g. frequency or amplitude by controlling the mutual position or the reflecting properties of the reflectors of the cavity, e.g. by controlling the cavity length
    • H01S3/1394—Stabilisation of laser output parameters, e.g. frequency or amplitude by controlling the mutual position or the reflecting properties of the reflectors of the cavity, e.g. by controlling the cavity length by using an active reference, e.g. second laser, klystron or other standard frequency source

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Nonlinear Science (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)

Abstract

An optical heterodyne sampling device includes: two pulsed laser sources which may have a jitter and which can receive respectively a pump beam and a probe beam having respective repetition frequencies Fs and Fp, whereby Fs≠Fp; and an element for combining the pump beam and the probe beam which are intended to be passed over a sample, consisting of a signal channel including a system for the photodetection of the response signal from the sample and a system for acquiring the photodetected signal, which is connected to the signal channel. According to the invention, Fs and Fp are essentially constant and the acquisition system includes an acquisition trigger element. A synchronization channel is connected to the trigger element, and includes a device for measuring the beat frequency |Fs−Fp| which can generate a synchronization signal comprising pulses each time the pulses of the pump beam and the probe beam coincide.
FR0510776A 2005-10-21 2005-10-21 HETERODYNE OPTICAL SAMPLING DEVICE Active FR2892511B1 (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
FR0510776A FR2892511B1 (en) 2005-10-21 2005-10-21 HETERODYNE OPTICAL SAMPLING DEVICE
DE602006005708T DE602006005708D1 (en) 2005-10-21 2006-10-20 OPTICAL HETERODYNE SAMPLING FACILITY
PCT/FR2006/002384 WO2007045773A1 (en) 2005-10-21 2006-10-20 Optical heterodyne sampling device
EP06831000A EP1949055B1 (en) 2005-10-21 2006-10-20 Optical heterodyne sampling device
AT06831000T ATE425445T1 (en) 2005-10-21 2006-10-20 OPTICAL HETERODYNE SAMPLING DEVICE
US12/090,893 US7728317B2 (en) 2005-10-21 2006-10-20 Optical heterodyne sampling device having probe and pump beams
JP2008536087A JP4897821B2 (en) 2005-10-21 2006-10-20 Optical heterodyne sampling device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0510776A FR2892511B1 (en) 2005-10-21 2005-10-21 HETERODYNE OPTICAL SAMPLING DEVICE

Publications (2)

Publication Number Publication Date
FR2892511A1 FR2892511A1 (en) 2007-04-27
FR2892511B1 true FR2892511B1 (en) 2008-05-09

Family

ID=36615627

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0510776A Active FR2892511B1 (en) 2005-10-21 2005-10-21 HETERODYNE OPTICAL SAMPLING DEVICE

Country Status (7)

Country Link
US (1) US7728317B2 (en)
EP (1) EP1949055B1 (en)
JP (1) JP4897821B2 (en)
AT (1) ATE425445T1 (en)
DE (1) DE602006005708D1 (en)
FR (1) FR2892511B1 (en)
WO (1) WO2007045773A1 (en)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8120778B2 (en) 2009-03-06 2012-02-21 Imra America, Inc. Optical scanning and imaging systems based on dual pulsed laser systems
US9153928B2 (en) * 2006-03-10 2015-10-06 Imra America, Inc. Optical signal processing with modelocked lasers
US8264693B2 (en) * 2007-12-06 2012-09-11 The Regents Of The University Of Michigan Method and system for measuring at least one property including a magnetic property of a material using pulsed laser sources
JP5148381B2 (en) * 2008-06-18 2013-02-20 株式会社アドバンテスト Light measuring device
FR2977320B1 (en) 2011-06-29 2014-11-21 Ecole Polytech SPECTROSCOPY IMPULSE MANAGEMENT DEVICE PROBE-PUMP.
US8724111B2 (en) 2011-08-16 2014-05-13 Alex Gusev Flash photolysis system
US8446587B2 (en) * 2011-08-16 2013-05-21 Alex Gusev Flash photolysis system
DE102011112893A1 (en) * 2011-09-06 2013-03-07 Philipp Kubina Method for time-resolved measurement of measurement signals generated in examination unit after stimulation by pulses and after scanning with temporally successive pulses, involves forming and digitalizing narrowband signals from pulses
KR101912671B1 (en) * 2012-09-24 2018-10-29 가부시키가이샤 아드반테스트 Optical measuring device, method, program, and recording medium
JP5865946B2 (en) 2014-05-22 2016-02-17 株式会社ユニソク Transient absorption measurement method and transient absorption measurement device
US20170299512A1 (en) * 2016-04-14 2017-10-19 Boyd V. Hunter Differential Excitation Raman Spectroscopy
FR3096781B1 (en) 2019-05-28 2021-06-04 Univ Bordeaux double-beam picosecond acoustic measurement system
FR3103896B1 (en) * 2019-11-29 2024-03-08 Neta Multi-point photo-acoustic measuring device
CN116879208B (en) * 2023-09-08 2023-11-28 星元极光(苏州)光电科技有限公司 Transient absorption spectrum measuring method and device

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3131621B2 (en) * 1991-09-27 2001-02-05 工業技術院長 Separation of hydrocarbons
US5778016A (en) * 1994-04-01 1998-07-07 Imra America, Inc. Scanning temporal ultrafast delay methods and apparatuses therefor
US5604592A (en) * 1994-09-19 1997-02-18 Textron Defense Systems, Division Of Avco Corporation Laser ultrasonics-based material analysis system and method using matched filter processing
US5814820A (en) * 1996-02-09 1998-09-29 The Board Of Trustees Of The University Of Illinois Pump probe cross correlation fluorescence frequency domain microscope and microscopy
US5978074A (en) * 1997-07-03 1999-11-02 Therma-Wave, Inc. Apparatus for evaluating metalized layers on semiconductors
US7009695B2 (en) * 2003-04-01 2006-03-07 Applied Materials, Inc. Full frame thermal pump probe technique for detecting subsurface defects

Also Published As

Publication number Publication date
EP1949055A1 (en) 2008-07-30
EP1949055B1 (en) 2009-03-11
WO2007045773A1 (en) 2007-04-26
JP4897821B2 (en) 2012-03-14
US20080251740A1 (en) 2008-10-16
ATE425445T1 (en) 2009-03-15
JP2009512848A (en) 2009-03-26
FR2892511A1 (en) 2007-04-27
US7728317B2 (en) 2010-06-01
DE602006005708D1 (en) 2009-04-23

Similar Documents

Publication Publication Date Title
FR2892511B1 (en) HETERODYNE OPTICAL SAMPLING DEVICE
US10036672B2 (en) Optical fiber strain and temperature measurement apparatus
ES2700875T3 (en) Apparatus and method of dual laser scanning interferometry
JP5753449B2 (en) Lightwave distance measuring method and lightwave distance apparatus
ATE464004T1 (en) OPTICAL BLOOD FLOW METER USING SELF-MIXING DOUPLER EFFECT
JP2017156094A (en) Brillouin scattering measuring method and brillouin scattering measuring apparatus
JP6019360B2 (en) Optical heterodyne rangefinder
RU2012117750A (en) PHASE READING
US20140043606A1 (en) Stimulated raman scattering detection apparatus
EP1574832A3 (en) Optical phase measurement of target
WO2007026286A3 (en) Method of measuring relative movement in two dimensions of an object and an optical input device using a single self-mixing laser
US10816368B2 (en) Method and system for high sensitivity in distributed fiber sensing applications
JPH1030965A (en) Apparatus and method for measurement of optical pulse characteristic
WO2020071128A1 (en) Backscattering optical amplification device, optical pulse testing device, backscattering optical amplification method and optical pulse testing method
EP2725385A1 (en) Distance measuring method and device
Lu et al. Dual-channel self-mixing vibration measurement system in a linear cavity fiber laser
US11867809B2 (en) Measurement apparatus and measurement method
JP6308183B2 (en) Optical fiber strain measuring device and optical fiber strain measuring method
Soriano-Amat et al. Frequency stability requirements in quasi-integer-ratio time-expanded phase-sensitive OTDR
FR2893411B1 (en) MONOCOUP PULSE PROFILE MEASUREMENT DEVICE OF VERY SHORT DURATION
EP4242754A3 (en) Virtual mirror technique for measuring time and frequency offsets between clocks on moving platforms
JP6774192B2 (en) Distance measuring device and distance measuring method
JP6722899B2 (en) Impulse response measuring device and its measuring method
JP2015087385A (en) Optical measurement device and optical measurement method
CN112433220B (en) Measuring device and measuring method

Legal Events

Date Code Title Description
PLFP Fee payment

Year of fee payment: 12

PLFP Fee payment

Year of fee payment: 13

PLFP Fee payment

Year of fee payment: 14

PLFP Fee payment

Year of fee payment: 15

PLFP Fee payment

Year of fee payment: 16

PLFP Fee payment

Year of fee payment: 17

PLFP Fee payment

Year of fee payment: 18

PLFP Fee payment

Year of fee payment: 19