FR2886755B1 - Guides emetteurs/recepteurs nanometriques - Google Patents
Guides emetteurs/recepteurs nanometriquesInfo
- Publication number
- FR2886755B1 FR2886755B1 FR0505706A FR0505706A FR2886755B1 FR 2886755 B1 FR2886755 B1 FR 2886755B1 FR 0505706 A FR0505706 A FR 0505706A FR 0505706 A FR0505706 A FR 0505706A FR 2886755 B1 FR2886755 B1 FR 2886755B1
- Authority
- FR
- France
- Prior art keywords
- translator
- nanometer
- receiver guides
- guides
- receiver
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/18—SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
- G01Q60/22—Probes, their manufacture, or their related instrumentation, e.g. holders
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/86—Scanning probe structure
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/902—Specified use of nanostructure
- Y10S977/932—Specified use of nanostructure for electronic or optoelectronic application
- Y10S977/943—Information storage or retrieval using nanostructure
- Y10S977/947—Information storage or retrieval using nanostructure with scanning probe instrument
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0505706A FR2886755B1 (fr) | 2005-06-06 | 2005-06-06 | Guides emetteurs/recepteurs nanometriques |
EP06778582A EP1889031A1 (fr) | 2005-06-06 | 2006-06-06 | Guides emetteurs/recepteurs nanometriques |
JP2008515250A JP5032467B2 (ja) | 2005-06-06 | 2006-06-06 | ナノメートル・サイズのエミッタ/レシーバ・ガイド |
PCT/FR2006/001279 WO2006131639A1 (fr) | 2005-06-06 | 2006-06-06 | Guides emetteurs/recepteurs nanometriques |
US11/916,647 US7945966B2 (en) | 2005-06-06 | 2006-06-06 | Nanometric emitter/receiver guides |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0505706A FR2886755B1 (fr) | 2005-06-06 | 2005-06-06 | Guides emetteurs/recepteurs nanometriques |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2886755A1 FR2886755A1 (fr) | 2006-12-08 |
FR2886755B1 true FR2886755B1 (fr) | 2009-06-05 |
Family
ID=35453458
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR0505706A Expired - Fee Related FR2886755B1 (fr) | 2005-06-06 | 2005-06-06 | Guides emetteurs/recepteurs nanometriques |
Country Status (5)
Country | Link |
---|---|
US (1) | US7945966B2 (fr) |
EP (1) | EP1889031A1 (fr) |
JP (1) | JP5032467B2 (fr) |
FR (1) | FR2886755B1 (fr) |
WO (1) | WO2006131639A1 (fr) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5033609B2 (ja) * | 2007-03-12 | 2012-09-26 | 株式会社日立製作所 | 走査プローブ顕微鏡およびこれを用いた試料の観察方法 |
JP5216509B2 (ja) * | 2008-03-05 | 2013-06-19 | 株式会社日立製作所 | 走査プローブ顕微鏡およびこれを用いた試料の観察方法 |
CN104345358B (zh) | 2013-07-26 | 2016-02-10 | 上海煦源生物科技有限公司 | 利用剥离-粘贴法在光纤端面制作金属微纳米结构的方法 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5272330A (en) * | 1990-11-19 | 1993-12-21 | At&T Bell Laboratories | Near field scanning optical microscope having a tapered waveguide |
JP3481583B2 (ja) * | 1994-05-31 | 2003-12-22 | 財団法人神奈川科学技術アカデミー | 光ファイバ及びその製造方法 |
JPH08178639A (ja) * | 1994-12-26 | 1996-07-12 | Olympus Optical Co Ltd | 走査型近接場光顕微鏡用カンチレバーの製造方法および製造装置および予備成形品 |
GB0002367D0 (en) * | 2000-02-03 | 2000-03-22 | Limited | Spectrometer |
JP2001338430A (ja) * | 2000-05-25 | 2001-12-07 | Minolta Co Ltd | 近接場光発生素子の製造方法及び該素子の調整方法 |
US6457350B1 (en) * | 2000-09-08 | 2002-10-01 | Fei Company | Carbon nanotube probe tip grown on a small probe |
US6680617B2 (en) * | 2000-09-20 | 2004-01-20 | Neocera, Inc. | Apertured probes for localized measurements of a material's complex permittivity and fabrication method |
JP2002124470A (ja) * | 2000-10-13 | 2002-04-26 | Hitachi Ltd | プラズマ処理方法およびスパッタ装置ならびに半導体装置の製造方法 |
JP2002256441A (ja) * | 2001-03-02 | 2002-09-11 | Kanagawa Acad Of Sci & Technol | 無電解めっき方法 |
US6947311B2 (en) * | 2003-06-10 | 2005-09-20 | University Of Basel | Two-dimensional structural transition controlled by an electric field, memory storage device thereof, and method of making a memory storage device |
-
2005
- 2005-06-06 FR FR0505706A patent/FR2886755B1/fr not_active Expired - Fee Related
-
2006
- 2006-06-06 WO PCT/FR2006/001279 patent/WO2006131639A1/fr active Application Filing
- 2006-06-06 EP EP06778582A patent/EP1889031A1/fr not_active Withdrawn
- 2006-06-06 US US11/916,647 patent/US7945966B2/en not_active Expired - Fee Related
- 2006-06-06 JP JP2008515250A patent/JP5032467B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP1889031A1 (fr) | 2008-02-20 |
JP2008545983A (ja) | 2008-12-18 |
WO2006131639A1 (fr) | 2006-12-14 |
FR2886755A1 (fr) | 2006-12-08 |
US7945966B2 (en) | 2011-05-17 |
JP5032467B2 (ja) | 2012-09-26 |
US20090172846A1 (en) | 2009-07-02 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |
Effective date: 20150227 |