FR2886755B1 - Guides emetteurs/recepteurs nanometriques - Google Patents

Guides emetteurs/recepteurs nanometriques

Info

Publication number
FR2886755B1
FR2886755B1 FR0505706A FR0505706A FR2886755B1 FR 2886755 B1 FR2886755 B1 FR 2886755B1 FR 0505706 A FR0505706 A FR 0505706A FR 0505706 A FR0505706 A FR 0505706A FR 2886755 B1 FR2886755 B1 FR 2886755B1
Authority
FR
France
Prior art keywords
translator
nanometer
receiver guides
guides
receiver
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0505706A
Other languages
English (en)
Other versions
FR2886755A1 (fr
Inventor
Tiberiu Minea
Guy Louarn
Guirec Ollivier
Marc Chaigneau
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre National de la Recherche Scientifique CNRS
Universite de Nantes
Original Assignee
Centre National de la Recherche Scientifique CNRS
Universite de Nantes
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre National de la Recherche Scientifique CNRS, Universite de Nantes filed Critical Centre National de la Recherche Scientifique CNRS
Priority to FR0505706A priority Critical patent/FR2886755B1/fr
Priority to EP06778582A priority patent/EP1889031A1/fr
Priority to JP2008515250A priority patent/JP5032467B2/ja
Priority to PCT/FR2006/001279 priority patent/WO2006131639A1/fr
Priority to US11/916,647 priority patent/US7945966B2/en
Publication of FR2886755A1 publication Critical patent/FR2886755A1/fr
Application granted granted Critical
Publication of FR2886755B1 publication Critical patent/FR2886755B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/18SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
    • G01Q60/22Probes, their manufacture, or their related instrumentation, e.g. holders
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y20/00Nanooptics, e.g. quantum optics or photonic crystals
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00Methods or apparatus for measurement or analysis of nanostructures
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00Nanotechnology
    • Y10S977/84Manufacture, treatment, or detection of nanostructure
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00Nanotechnology
    • Y10S977/84Manufacture, treatment, or detection of nanostructure
    • Y10S977/849Manufacture, treatment, or detection of nanostructure with scanning probe
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00Nanotechnology
    • Y10S977/84Manufacture, treatment, or detection of nanostructure
    • Y10S977/849Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/86Scanning probe structure
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00Nanotechnology
    • Y10S977/902Specified use of nanostructure
    • Y10S977/932Specified use of nanostructure for electronic or optoelectronic application
    • Y10S977/943Information storage or retrieval using nanostructure
    • Y10S977/947Information storage or retrieval using nanostructure with scanning probe instrument
FR0505706A 2005-06-06 2005-06-06 Guides emetteurs/recepteurs nanometriques Expired - Fee Related FR2886755B1 (fr)

Priority Applications (5)

Application Number Priority Date Filing Date Title
FR0505706A FR2886755B1 (fr) 2005-06-06 2005-06-06 Guides emetteurs/recepteurs nanometriques
EP06778582A EP1889031A1 (fr) 2005-06-06 2006-06-06 Guides emetteurs/recepteurs nanometriques
JP2008515250A JP5032467B2 (ja) 2005-06-06 2006-06-06 ナノメートル・サイズのエミッタ/レシーバ・ガイド
PCT/FR2006/001279 WO2006131639A1 (fr) 2005-06-06 2006-06-06 Guides emetteurs/recepteurs nanometriques
US11/916,647 US7945966B2 (en) 2005-06-06 2006-06-06 Nanometric emitter/receiver guides

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0505706A FR2886755B1 (fr) 2005-06-06 2005-06-06 Guides emetteurs/recepteurs nanometriques

Publications (2)

Publication Number Publication Date
FR2886755A1 FR2886755A1 (fr) 2006-12-08
FR2886755B1 true FR2886755B1 (fr) 2009-06-05

Family

ID=35453458

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0505706A Expired - Fee Related FR2886755B1 (fr) 2005-06-06 2005-06-06 Guides emetteurs/recepteurs nanometriques

Country Status (5)

Country Link
US (1) US7945966B2 (fr)
EP (1) EP1889031A1 (fr)
JP (1) JP5032467B2 (fr)
FR (1) FR2886755B1 (fr)
WO (1) WO2006131639A1 (fr)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5033609B2 (ja) * 2007-03-12 2012-09-26 株式会社日立製作所 走査プローブ顕微鏡およびこれを用いた試料の観察方法
JP5216509B2 (ja) * 2008-03-05 2013-06-19 株式会社日立製作所 走査プローブ顕微鏡およびこれを用いた試料の観察方法
CN104345358B (zh) 2013-07-26 2016-02-10 上海煦源生物科技有限公司 利用剥离-粘贴法在光纤端面制作金属微纳米结构的方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5272330A (en) * 1990-11-19 1993-12-21 At&T Bell Laboratories Near field scanning optical microscope having a tapered waveguide
JP3481583B2 (ja) * 1994-05-31 2003-12-22 財団法人神奈川科学技術アカデミー 光ファイバ及びその製造方法
JPH08178639A (ja) * 1994-12-26 1996-07-12 Olympus Optical Co Ltd 走査型近接場光顕微鏡用カンチレバーの製造方法および製造装置および予備成形品
GB0002367D0 (en) * 2000-02-03 2000-03-22 Limited Spectrometer
JP2001338430A (ja) * 2000-05-25 2001-12-07 Minolta Co Ltd 近接場光発生素子の製造方法及び該素子の調整方法
US6457350B1 (en) * 2000-09-08 2002-10-01 Fei Company Carbon nanotube probe tip grown on a small probe
US6680617B2 (en) * 2000-09-20 2004-01-20 Neocera, Inc. Apertured probes for localized measurements of a material's complex permittivity and fabrication method
JP2002124470A (ja) * 2000-10-13 2002-04-26 Hitachi Ltd プラズマ処理方法およびスパッタ装置ならびに半導体装置の製造方法
JP2002256441A (ja) * 2001-03-02 2002-09-11 Kanagawa Acad Of Sci & Technol 無電解めっき方法
US6947311B2 (en) * 2003-06-10 2005-09-20 University Of Basel Two-dimensional structural transition controlled by an electric field, memory storage device thereof, and method of making a memory storage device

Also Published As

Publication number Publication date
EP1889031A1 (fr) 2008-02-20
JP2008545983A (ja) 2008-12-18
WO2006131639A1 (fr) 2006-12-14
FR2886755A1 (fr) 2006-12-08
US7945966B2 (en) 2011-05-17
JP5032467B2 (ja) 2012-09-26
US20090172846A1 (en) 2009-07-02

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20150227