FR2886407B1 - Injecteur local d'electrons polarises de spin a pointe en semi-conducteur sous excitation lumineuse - Google Patents
Injecteur local d'electrons polarises de spin a pointe en semi-conducteur sous excitation lumineuseInfo
- Publication number
- FR2886407B1 FR2886407B1 FR0505394A FR0505394A FR2886407B1 FR 2886407 B1 FR2886407 B1 FR 2886407B1 FR 0505394 A FR0505394 A FR 0505394A FR 0505394 A FR0505394 A FR 0505394A FR 2886407 B1 FR2886407 B1 FR 2886407B1
- Authority
- FR
- France
- Prior art keywords
- light excitation
- under light
- polarized electron
- point under
- electron spin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/02—Multiple-type SPM, i.e. involving more than one SPM techniques
- G01Q60/04—STM [Scanning Tunnelling Microscopy] combined with AFM [Atomic Force Microscopy]
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/02—Multiple-type SPM, i.e. involving more than one SPM techniques
- G01Q60/08—MFM [Magnetic Force Microscopy] combined with AFM [Atomic Force Microscopy
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
- G01Q70/08—Probe characteristics
- G01Q70/14—Particular materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q80/00—Applications, other than SPM, of scanning-probe techniques
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Analytical Chemistry (AREA)
- Crystallography & Structural Chemistry (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0505394A FR2886407B1 (fr) | 2005-05-27 | 2005-05-27 | Injecteur local d'electrons polarises de spin a pointe en semi-conducteur sous excitation lumineuse |
EP06763243A EP1883932A1 (fr) | 2005-05-27 | 2006-05-23 | Injecteur local d'electrons polarises de spin a pointe en semi-conducteur sous excitation lumineuse |
US11/915,611 US7841016B2 (en) | 2005-05-27 | 2006-05-23 | Local injector of spin-polarized electrons with semiconductor tip under light excitation |
PCT/EP2006/062550 WO2006125788A1 (fr) | 2005-05-27 | 2006-05-23 | Injecteur local d'electrons polarises de spin a pointe en semi-conducteur sous excitation lumineuse |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0505394A FR2886407B1 (fr) | 2005-05-27 | 2005-05-27 | Injecteur local d'electrons polarises de spin a pointe en semi-conducteur sous excitation lumineuse |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2886407A1 FR2886407A1 (fr) | 2006-12-01 |
FR2886407B1 true FR2886407B1 (fr) | 2007-09-28 |
Family
ID=35447432
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR0505394A Expired - Fee Related FR2886407B1 (fr) | 2005-05-27 | 2005-05-27 | Injecteur local d'electrons polarises de spin a pointe en semi-conducteur sous excitation lumineuse |
Country Status (4)
Country | Link |
---|---|
US (1) | US7841016B2 (fr) |
EP (1) | EP1883932A1 (fr) |
FR (1) | FR2886407B1 (fr) |
WO (1) | WO2006125788A1 (fr) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2104111A1 (fr) * | 2008-03-20 | 2009-09-23 | Nanoworld AG | Sonde pour SPM avec un porte-à-faux raccourci |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0355241A1 (fr) * | 1988-08-18 | 1990-02-28 | International Business Machines Corporation | Microscope à effet tunnel à polarisation de spin |
FR2682128B1 (fr) | 1991-10-08 | 1993-12-03 | Thomson Csf | Procede de croissance de couches heteroepitaxiales. |
FR2689680B1 (fr) | 1992-04-02 | 2001-08-10 | Thomson Csf | Procédé de réalisation de couches minces hétéroépitaxiales et de dispositifs électroniques. |
DE69319933T2 (de) * | 1993-11-03 | 1999-03-25 | Ibm | Methode und gerät zur wiedergewinnung digitaler daten von einem magnetischen speichermedium |
RU2168237C2 (ru) | 1999-05-11 | 2001-05-27 | Берковиц Владимир Леонидович | Способ получения нитридной пленки на поверхности полупроводниковых соединений а3в5 |
US8553517B2 (en) * | 2002-10-14 | 2013-10-08 | Samsung Electronics Co., Ltd. | Magnetic medium using spin-polarized electrons and apparatus and method of recording data on the magnetic medium |
US20050017171A1 (en) * | 2003-07-08 | 2005-01-27 | Btg International Limited | Probe structures incorporating nanowhiskers, production methods thereof and methods of forming nanowhiskers |
-
2005
- 2005-05-27 FR FR0505394A patent/FR2886407B1/fr not_active Expired - Fee Related
-
2006
- 2006-05-23 EP EP06763243A patent/EP1883932A1/fr not_active Withdrawn
- 2006-05-23 US US11/915,611 patent/US7841016B2/en not_active Expired - Fee Related
- 2006-05-23 WO PCT/EP2006/062550 patent/WO2006125788A1/fr not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
FR2886407A1 (fr) | 2006-12-01 |
US7841016B2 (en) | 2010-11-23 |
US20080210864A1 (en) | 2008-09-04 |
EP1883932A1 (fr) | 2008-02-06 |
WO2006125788A1 (fr) | 2006-11-30 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |
Effective date: 20150130 |