FR2880194B1 - IMAGE SENSOR WITH GLOBALLY SEPARATE COLORED ZONES - Google Patents

IMAGE SENSOR WITH GLOBALLY SEPARATE COLORED ZONES

Info

Publication number
FR2880194B1
FR2880194B1 FR0413961A FR0413961A FR2880194B1 FR 2880194 B1 FR2880194 B1 FR 2880194B1 FR 0413961 A FR0413961 A FR 0413961A FR 0413961 A FR0413961 A FR 0413961A FR 2880194 B1 FR2880194 B1 FR 2880194B1
Authority
FR
France
Prior art keywords
globally
image sensor
colored zones
separate colored
separate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0413961A
Other languages
French (fr)
Other versions
FR2880194A1 (en
Inventor
Louis Brissot
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teledyne e2v Semiconductors SAS
Original Assignee
Atmel Grenoble SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Atmel Grenoble SA filed Critical Atmel Grenoble SA
Priority to FR0413961A priority Critical patent/FR2880194B1/en
Priority to EP05823548A priority patent/EP1829109A1/en
Priority to JP2007547434A priority patent/JP2008526062A/en
Priority to CA002590667A priority patent/CA2590667A1/en
Priority to PCT/EP2005/056376 priority patent/WO2006069886A1/en
Priority to CNA2005800443244A priority patent/CN101088163A/en
Publication of FR2880194A1 publication Critical patent/FR2880194A1/en
Application granted granted Critical
Publication of FR2880194B1 publication Critical patent/FR2880194B1/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14618—Containers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14625—Optical elements or arrangements associated with the device
    • H01L27/14627—Microlenses
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/1464—Back illuminated imager structures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Color Television Image Signal Generators (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
FR0413961A 2004-12-24 2004-12-24 IMAGE SENSOR WITH GLOBALLY SEPARATE COLORED ZONES Expired - Fee Related FR2880194B1 (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
FR0413961A FR2880194B1 (en) 2004-12-24 2004-12-24 IMAGE SENSOR WITH GLOBALLY SEPARATE COLORED ZONES
EP05823548A EP1829109A1 (en) 2004-12-24 2005-12-01 Image sensor with globally separate colour zones
JP2007547434A JP2008526062A (en) 2004-12-24 2005-12-01 Image sensor with totally separate color zones
CA002590667A CA2590667A1 (en) 2004-12-24 2005-12-01 Image sensor with globally separate colour zones
PCT/EP2005/056376 WO2006069886A1 (en) 2004-12-24 2005-12-01 Image sensor with globally separate colour zones
CNA2005800443244A CN101088163A (en) 2004-12-24 2005-12-01 Image sensor with globally separate colour zones

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0413961A FR2880194B1 (en) 2004-12-24 2004-12-24 IMAGE SENSOR WITH GLOBALLY SEPARATE COLORED ZONES

Publications (2)

Publication Number Publication Date
FR2880194A1 FR2880194A1 (en) 2006-06-30
FR2880194B1 true FR2880194B1 (en) 2007-06-01

Family

ID=34955061

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0413961A Expired - Fee Related FR2880194B1 (en) 2004-12-24 2004-12-24 IMAGE SENSOR WITH GLOBALLY SEPARATE COLORED ZONES

Country Status (6)

Country Link
EP (1) EP1829109A1 (en)
JP (1) JP2008526062A (en)
CN (1) CN101088163A (en)
CA (1) CA2590667A1 (en)
FR (1) FR2880194B1 (en)
WO (1) WO2006069886A1 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100976886B1 (en) 2006-12-22 2010-08-18 크로스텍 캐피탈, 엘엘씨 CMOS Image Sensors with Floating Base Readout Concept
JP5233897B2 (en) * 2009-07-31 2013-07-10 ソニー株式会社 Image processing apparatus and method
JP5816015B2 (en) 2011-07-15 2015-11-17 株式会社東芝 Solid-state imaging device and camera module
WO2013049948A1 (en) * 2011-10-06 2013-04-11 Heptagon Micro Optics Pte. Ltd. Method for wafer-level manufacturing of objects and corresponding semi-finished products

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4777496B2 (en) * 2000-02-10 2011-09-21 富士フイルム株式会社 Solid-state image sensor
JP4518616B2 (en) * 2000-04-13 2010-08-04 ソニー株式会社 Solid-state imaging device, driving method thereof, and camera system
FR2817106B1 (en) * 2000-11-17 2003-03-07 Trixell Sas PHOTOSENSITIVE DEVICE AND METHOD FOR CONTROLLING THE PHOTOSENSITIVE DEVICE
FR2819941B1 (en) * 2001-01-25 2003-06-20 Get Int PHOTOELECTRIC ELEMENT WITH VERY HIGH OPERATING DYNAMICS
FR2829289B1 (en) * 2001-08-31 2004-11-19 Atmel Grenoble Sa COLOR IMAGE SENSOR WITH IMPROVED COLORIMETRY AND MANUFACTURING METHOD

Also Published As

Publication number Publication date
WO2006069886A1 (en) 2006-07-06
JP2008526062A (en) 2008-07-17
FR2880194A1 (en) 2006-06-30
CN101088163A (en) 2007-12-12
EP1829109A1 (en) 2007-09-05
CA2590667A1 (en) 2006-07-06

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Legal Events

Date Code Title Description
PLFP Fee payment

Year of fee payment: 12

PLFP Fee payment

Year of fee payment: 13

PLFP Fee payment

Year of fee payment: 14

CD Change of name or company name

Owner name: TELEDYNE E2V SEMICONDUCTORS SAS, FR

Effective date: 20180907

CJ Change in legal form

Effective date: 20180907

ST Notification of lapse

Effective date: 20190906