FR2849504B1 - PROCESS FOR THE OPTICAL CHARACTERIZATION OF MATERIALS WITHOUT THE USE OF A PHYSICAL MODEL - Google Patents
PROCESS FOR THE OPTICAL CHARACTERIZATION OF MATERIALS WITHOUT THE USE OF A PHYSICAL MODELInfo
- Publication number
- FR2849504B1 FR2849504B1 FR0216847A FR0216847A FR2849504B1 FR 2849504 B1 FR2849504 B1 FR 2849504B1 FR 0216847 A FR0216847 A FR 0216847A FR 0216847 A FR0216847 A FR 0216847A FR 2849504 B1 FR2849504 B1 FR 2849504B1
- Authority
- FR
- France
- Prior art keywords
- materials
- physical model
- optical characterization
- characterization
- optical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
- G01N21/211—Ellipsometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
- G01N21/211—Ellipsometry
- G01N2021/213—Spectrometric ellipsometry
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0216847A FR2849504B1 (en) | 2002-12-30 | 2002-12-30 | PROCESS FOR THE OPTICAL CHARACTERIZATION OF MATERIALS WITHOUT THE USE OF A PHYSICAL MODEL |
FR0350635A FR2849505B1 (en) | 2002-12-30 | 2003-10-02 | PROCESS FOR THE OPTICAL CHARACTERIZATION OF MATERIALS WITHOUT THE USE OF A PHYSICAL MODEL |
PCT/FR2003/050211 WO2004061432A2 (en) | 2002-12-30 | 2003-12-24 | Method for the optical characterization of materials without using a physical model |
EP03810019.4A EP1579197B1 (en) | 2002-12-30 | 2003-12-24 | Method for the optical characterization of materials without using a physical model |
US10/540,003 US7307723B2 (en) | 2002-12-30 | 2003-12-24 | Method for the optical characterization of materials without using a physical model |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0216847A FR2849504B1 (en) | 2002-12-30 | 2002-12-30 | PROCESS FOR THE OPTICAL CHARACTERIZATION OF MATERIALS WITHOUT THE USE OF A PHYSICAL MODEL |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2849504A1 FR2849504A1 (en) | 2004-07-02 |
FR2849504B1 true FR2849504B1 (en) | 2005-03-11 |
Family
ID=32480279
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR0216847A Expired - Fee Related FR2849504B1 (en) | 2002-12-30 | 2002-12-30 | PROCESS FOR THE OPTICAL CHARACTERIZATION OF MATERIALS WITHOUT THE USE OF A PHYSICAL MODEL |
Country Status (1)
Country | Link |
---|---|
FR (1) | FR2849504B1 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2859781B1 (en) | 2003-09-17 | 2007-07-06 | Commissariat Energie Atomique | USE OF OPTICAL FOURIER TRANSFORMATION FOR DIMENSIONAL MICROELECTRONIC CONTROL |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5956145A (en) * | 1992-09-18 | 1999-09-21 | J. A. Woollam Co. Inc. | System and method for improving data acquisition capability in spectroscopic rotatable element, rotating element, modulation element, and other ellipsometer and polarimeter and the like systems |
US7099005B1 (en) * | 2000-09-27 | 2006-08-29 | Kla-Tencor Technologies Corporation | System for scatterometric measurements and applications |
-
2002
- 2002-12-30 FR FR0216847A patent/FR2849504B1/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
FR2849504A1 (en) | 2004-07-02 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PLFP | Fee payment |
Year of fee payment: 14 |
|
PLFP | Fee payment |
Year of fee payment: 15 |
|
PLFP | Fee payment |
Year of fee payment: 16 |
|
ST | Notification of lapse |
Effective date: 20190906 |