FR2848037B1 - Systeme et procede pour entendre une largeur d'impulsion - Google Patents

Systeme et procede pour entendre une largeur d'impulsion

Info

Publication number
FR2848037B1
FR2848037B1 FR0215156A FR0215156A FR2848037B1 FR 2848037 B1 FR2848037 B1 FR 2848037B1 FR 0215156 A FR0215156 A FR 0215156A FR 0215156 A FR0215156 A FR 0215156A FR 2848037 B1 FR2848037 B1 FR 2848037B1
Authority
FR
France
Prior art keywords
hearing
pulse width
pulse
width
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0215156A
Other languages
English (en)
Other versions
FR2848037A1 (fr
Inventor
Severin Barth
Fabrice Picot
Philippe Coll
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Atmel Corp
Original Assignee
Atmel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Atmel Corp filed Critical Atmel Corp
Priority to FR0215156A priority Critical patent/FR2848037B1/fr
Priority to US10/379,484 priority patent/US6753713B1/en
Priority to JP2004557158A priority patent/JP2006520113A/ja
Priority to CNA2003801043131A priority patent/CN101061549A/zh
Priority to PCT/US2003/035203 priority patent/WO2004051704A2/fr
Priority to AU2003291225A priority patent/AU2003291225A1/en
Priority to KR1020057010006A priority patent/KR20050085303A/ko
Priority to EP03783154A priority patent/EP1579483A4/fr
Priority to CA002507693A priority patent/CA2507693A1/fr
Priority to TW092132692A priority patent/TW200414225A/zh
Publication of FR2848037A1 publication Critical patent/FR2848037A1/fr
Application granted granted Critical
Publication of FR2848037B1 publication Critical patent/FR2848037B1/fr
Priority to NO20053191A priority patent/NO20053191L/no
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/01—Details
    • H03K3/017—Adjustment of width or dutycycle of pulses
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/028—Detection or location of defective auxiliary circuits, e.g. defective refresh counters with adaption or trimming of parameters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
    • G11C11/413—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
    • G11C11/417—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction for memory cells of the field-effect type
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50—Marginal testing, e.g. race, voltage or current testing
    • G11C29/50012—Marginal testing, e.g. race, voltage or current testing of timing
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/01—Shaping pulses
    • H03K5/04—Shaping pulses by increasing duration; by decreasing duration
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
FR0215156A 2002-12-02 2002-12-02 Systeme et procede pour entendre une largeur d'impulsion Expired - Fee Related FR2848037B1 (fr)

Priority Applications (11)

Application Number Priority Date Filing Date Title
FR0215156A FR2848037B1 (fr) 2002-12-02 2002-12-02 Systeme et procede pour entendre une largeur d'impulsion
US10/379,484 US6753713B1 (en) 2002-12-02 2003-03-03 System and method for expanding a pulse width
EP03783154A EP1579483A4 (fr) 2002-12-02 2003-11-04 Systeme et procede pour developper une largeur d'impulsions
PCT/US2003/035203 WO2004051704A2 (fr) 2002-12-02 2003-11-04 Systeme et procede pour developper une largeur d'impulsions
AU2003291225A AU2003291225A1 (en) 2002-12-02 2003-11-04 System and method for expanding a pulse width
KR1020057010006A KR20050085303A (ko) 2002-12-02 2003-11-04 펄스 폭 확장 시스템 및 방법
JP2004557158A JP2006520113A (ja) 2002-12-02 2003-11-04 パルス幅を拡大するためのシステムおよび方法
CA002507693A CA2507693A1 (fr) 2002-12-02 2003-11-04 Systeme et procede pour developper une largeur d'impulsions
CNA2003801043131A CN101061549A (zh) 2002-12-02 2003-11-04 用于拓宽脉冲宽度的系统和方法
TW092132692A TW200414225A (en) 2002-12-02 2003-11-21 System and method for expanding a pulse width
NO20053191A NO20053191L (no) 2002-12-02 2005-06-30 System og fremgangsmate for a utvide en pulsbredde.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0215156A FR2848037B1 (fr) 2002-12-02 2002-12-02 Systeme et procede pour entendre une largeur d'impulsion

Publications (2)

Publication Number Publication Date
FR2848037A1 FR2848037A1 (fr) 2004-06-04
FR2848037B1 true FR2848037B1 (fr) 2005-01-14

Family

ID=32309918

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0215156A Expired - Fee Related FR2848037B1 (fr) 2002-12-02 2002-12-02 Systeme et procede pour entendre une largeur d'impulsion

Country Status (11)

Country Link
US (1) US6753713B1 (fr)
EP (1) EP1579483A4 (fr)
JP (1) JP2006520113A (fr)
KR (1) KR20050085303A (fr)
CN (1) CN101061549A (fr)
AU (1) AU2003291225A1 (fr)
CA (1) CA2507693A1 (fr)
FR (1) FR2848037B1 (fr)
NO (1) NO20053191L (fr)
TW (1) TW200414225A (fr)
WO (1) WO2004051704A2 (fr)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI333332B (en) * 2007-03-13 2010-11-11 Novatek Microelectronics Corp Pulse extension circuits for extending pulse signals
KR101823287B1 (ko) 2014-03-20 2018-01-29 닛본 덴끼 가부시끼가이샤 종단 장치, 종단 제어 방법, 및 종단 제어 프로그램이 기억된 기억매체
CN103929155B (zh) * 2014-04-30 2017-01-11 广州视源电子科技股份有限公司 脉冲宽度拓宽电路
CN107272485A (zh) * 2017-06-16 2017-10-20 中国科学院苏州生物医学工程技术研究所 一种基于低速adc的脉冲信号采集装置及方法
KR102636148B1 (ko) * 2017-11-21 2024-02-14 삼성전자주식회사 신호 수신기의 동작 방법, 펄스 폭 제어기, 및 그것들을 포함하는 전자 장치

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61177019A (ja) * 1985-01-31 1986-08-08 Matsushita Electric Ind Co Ltd パルスストレツチ回路
JP3426608B2 (ja) * 1990-04-04 2003-07-14 ユニシス コーポレイシヨン クロック・デスキュー回路
KR100189740B1 (ko) * 1996-03-11 1999-06-01 구본준 어드레스 천이 검출 회로
US5856753A (en) * 1996-03-29 1999-01-05 Cypress Semiconductor Corp. Output circuit for 3V/5V clock chip duty cycle adjustments
US5793699A (en) * 1997-03-04 1998-08-11 Sgs-Thomson Microelectronics S.R.L. Circuit for the generation and reset of timing signal used for reading a memory device
US5995444A (en) * 1997-12-30 1999-11-30 Stmicroelectronics, Inc. Edge transition detection control of a memory device
US6346841B2 (en) * 1998-06-29 2002-02-12 Hyundai Electronics Industries Co., Ltd. Pulse generator
JP2001101870A (ja) * 1999-09-30 2001-04-13 Fujitsu Ltd 半導体集積回路
KR100434201B1 (ko) * 2001-06-15 2004-06-04 동부전자 주식회사 반도체 패키지 및 그 제조 방법

Also Published As

Publication number Publication date
WO2004051704A2 (fr) 2004-06-17
FR2848037A1 (fr) 2004-06-04
JP2006520113A (ja) 2006-08-31
US6753713B1 (en) 2004-06-22
TW200414225A (en) 2004-08-01
EP1579483A4 (fr) 2008-10-29
US20040104752A1 (en) 2004-06-03
WO2004051704A3 (fr) 2007-01-18
NO20053191D0 (no) 2005-06-30
AU2003291225A1 (en) 2004-06-23
EP1579483A2 (fr) 2005-09-28
CA2507693A1 (fr) 2004-06-17
KR20050085303A (ko) 2005-08-29
CN101061549A (zh) 2007-10-24
AU2003291225A8 (en) 2004-06-23
NO20053191L (no) 2005-06-30

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20110831