FR2844056B1 - ANALYSIS INSTALLATION OF AN INTEGRATED CIRCUIT - Google Patents

ANALYSIS INSTALLATION OF AN INTEGRATED CIRCUIT

Info

Publication number
FR2844056B1
FR2844056B1 FR0210630A FR0210630A FR2844056B1 FR 2844056 B1 FR2844056 B1 FR 2844056B1 FR 0210630 A FR0210630 A FR 0210630A FR 0210630 A FR0210630 A FR 0210630A FR 2844056 B1 FR2844056 B1 FR 2844056B1
Authority
FR
France
Prior art keywords
integrated circuit
analysis installation
analysis
installation
integrated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0210630A
Other languages
French (fr)
Other versions
FR2844056A1 (en
Inventor
Philippe Perdu
Romain Desplats
Felix Beaudoin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre National dEtudes Spatiales CNES
Original Assignee
Centre National dEtudes Spatiales CNES
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre National dEtudes Spatiales CNES filed Critical Centre National dEtudes Spatiales CNES
Priority to FR0210630A priority Critical patent/FR2844056B1/en
Publication of FR2844056A1 publication Critical patent/FR2844056A1/en
Application granted granted Critical
Publication of FR2844056B1 publication Critical patent/FR2844056B1/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/305—Contactless testing using electron beams
    • G01R31/307—Contactless testing using electron beams of integrated circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/312—Contactless testing by capacitive methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/315—Contactless testing by inductive methods
FR0210630A 2002-08-27 2002-08-27 ANALYSIS INSTALLATION OF AN INTEGRATED CIRCUIT Expired - Fee Related FR2844056B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR0210630A FR2844056B1 (en) 2002-08-27 2002-08-27 ANALYSIS INSTALLATION OF AN INTEGRATED CIRCUIT

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0210630A FR2844056B1 (en) 2002-08-27 2002-08-27 ANALYSIS INSTALLATION OF AN INTEGRATED CIRCUIT

Publications (2)

Publication Number Publication Date
FR2844056A1 FR2844056A1 (en) 2004-03-05
FR2844056B1 true FR2844056B1 (en) 2005-04-29

Family

ID=31502932

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0210630A Expired - Fee Related FR2844056B1 (en) 2002-08-27 2002-08-27 ANALYSIS INSTALLATION OF AN INTEGRATED CIRCUIT

Country Status (1)

Country Link
FR (1) FR2844056B1 (en)

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0492677B1 (en) * 1990-11-28 1996-06-12 Schlumberger Technologies, Inc. Pulsed laser photoemission electron-beam probe
JPH04343245A (en) * 1991-05-21 1992-11-30 Mitsubishi Electric Corp Device for evaluating semiconductor device
US6184696B1 (en) * 1998-03-23 2001-02-06 Conexant Systems, Inc. Use of converging beams for transmitting electromagnetic energy to power devices for die testing

Also Published As

Publication number Publication date
FR2844056A1 (en) 2004-03-05

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20110502