FR2768860B1 - STRUCTURE AND METHOD FOR REPAIRING INTEGRATED CIRCUITS - Google Patents

STRUCTURE AND METHOD FOR REPAIRING INTEGRATED CIRCUITS

Info

Publication number
FR2768860B1
FR2768860B1 FR9712168A FR9712168A FR2768860B1 FR 2768860 B1 FR2768860 B1 FR 2768860B1 FR 9712168 A FR9712168 A FR 9712168A FR 9712168 A FR9712168 A FR 9712168A FR 2768860 B1 FR2768860 B1 FR 2768860B1
Authority
FR
France
Prior art keywords
integrated circuits
repairing integrated
repairing
circuits
integrated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9712168A
Other languages
French (fr)
Other versions
FR2768860A1 (en
Inventor
Philippe Chaisemartin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SA
Original Assignee
SGS Thomson Microelectronics SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SGS Thomson Microelectronics SA filed Critical SGS Thomson Microelectronics SA
Priority to FR9712168A priority Critical patent/FR2768860B1/en
Priority to US09/152,778 priority patent/US6236228B1/en
Priority to EP98410107A priority patent/EP0905766B1/en
Priority to DE69837980T priority patent/DE69837980D1/en
Publication of FR2768860A1 publication Critical patent/FR2768860A1/en
Application granted granted Critical
Publication of FR2768860B1 publication Critical patent/FR2768860B1/en
Priority to US09/911,344 priority patent/US6586961B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/80—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
    • H01L23/525—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body with adaptable interconnections
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
    • H01L23/528—Geometry or layout of the interconnection structure
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
FR9712168A 1997-09-25 1997-09-25 STRUCTURE AND METHOD FOR REPAIRING INTEGRATED CIRCUITS Expired - Fee Related FR2768860B1 (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
FR9712168A FR2768860B1 (en) 1997-09-25 1997-09-25 STRUCTURE AND METHOD FOR REPAIRING INTEGRATED CIRCUITS
US09/152,778 US6236228B1 (en) 1997-09-25 1998-09-14 Structure and method of repair of integrated circuits
EP98410107A EP0905766B1 (en) 1997-09-25 1998-09-24 Structure and method to repair integrated circuits
DE69837980T DE69837980D1 (en) 1997-09-25 1998-09-24 Structure and method for repairing an integrated circuit
US09/911,344 US6586961B2 (en) 1997-09-25 2001-07-23 Structure and method of repair of integrated circuits

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9712168A FR2768860B1 (en) 1997-09-25 1997-09-25 STRUCTURE AND METHOD FOR REPAIRING INTEGRATED CIRCUITS

Publications (2)

Publication Number Publication Date
FR2768860A1 FR2768860A1 (en) 1999-03-26
FR2768860B1 true FR2768860B1 (en) 1999-11-26

Family

ID=9511644

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9712168A Expired - Fee Related FR2768860B1 (en) 1997-09-25 1997-09-25 STRUCTURE AND METHOD FOR REPAIRING INTEGRATED CIRCUITS

Country Status (4)

Country Link
US (2) US6236228B1 (en)
EP (1) EP0905766B1 (en)
DE (1) DE69837980D1 (en)
FR (1) FR2768860B1 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2768860B1 (en) 1997-09-25 1999-11-26 Sgs Thomson Microelectronics STRUCTURE AND METHOD FOR REPAIRING INTEGRATED CIRCUITS
US20050144524A1 (en) * 2003-12-04 2005-06-30 International Business Machines Corporation Digital reliability monitor having autonomic repair and notification capability
US7287177B2 (en) * 2003-12-04 2007-10-23 International Business Machines Corporation Digital reliability monitor having autonomic repair and notification capability
KR100718216B1 (en) * 2004-12-13 2007-05-15 가부시끼가이샤 도시바 Semiconductor device, pattern layout designing method, exposure mask
WO2015015319A2 (en) * 2013-05-03 2015-02-05 Blackcomb Design Automation Inc. Architecture of spare wiring structures for improved engineering change orders

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5679967A (en) * 1985-01-20 1997-10-21 Chip Express (Israel) Ltd. Customizable three metal layer gate array devices
US5512397A (en) 1988-05-16 1996-04-30 Leedy; Glenn J. Stepper scanner discretionary lithography and common mask discretionary lithography for integrated circuits
DE69322667D1 (en) * 1992-02-18 1999-02-04 Elm Technology Corp Lithography as needed for integrated circuits
JPH06125067A (en) * 1992-10-12 1994-05-06 Mitsubishi Electric Corp Semiconductor integrated circuit and designing method therefor
JP2909328B2 (en) * 1992-11-02 1999-06-23 株式会社東芝 Field programmable gate array
US5777887A (en) * 1995-05-12 1998-07-07 Crosspoint Solutions, Inc. FPGA redundancy
US5798937A (en) * 1995-09-28 1998-08-25 Motorola, Inc. Method and apparatus for forming redundant vias between conductive layers of an integrated circuit
FR2741475B1 (en) * 1995-11-17 2000-05-12 Commissariat Energie Atomique METHOD OF MANUFACTURING A MICRO-ELECTRONICS DEVICE INCLUDING A PLURALITY OF INTERCONNECTED ELEMENTS ON A SUBSTRATE
US5892249A (en) * 1996-02-23 1999-04-06 National Semiconductor Corporation Integrated circuit having reprogramming cell
FR2768860B1 (en) 1997-09-25 1999-11-26 Sgs Thomson Microelectronics STRUCTURE AND METHOD FOR REPAIRING INTEGRATED CIRCUITS
US6404226B1 (en) * 1999-09-21 2002-06-11 Lattice Semiconductor Corporation Integrated circuit with standard cell logic and spare gates

Also Published As

Publication number Publication date
EP0905766B1 (en) 2007-06-27
FR2768860A1 (en) 1999-03-26
DE69837980D1 (en) 2007-08-09
EP0905766A1 (en) 1999-03-31
US20020093037A1 (en) 2002-07-18
US6586961B2 (en) 2003-07-01
US6236228B1 (en) 2001-05-22

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Legal Events

Date Code Title Description
CD Change of name or company name
ST Notification of lapse

Effective date: 20060531