FR2766275B1 - Circuit de validation de modeles de simulation - Google Patents

Circuit de validation de modeles de simulation

Info

Publication number
FR2766275B1
FR2766275B1 FR9709529A FR9709529A FR2766275B1 FR 2766275 B1 FR2766275 B1 FR 2766275B1 FR 9709529 A FR9709529 A FR 9709529A FR 9709529 A FR9709529 A FR 9709529A FR 2766275 B1 FR2766275 B1 FR 2766275B1
Authority
FR
France
Prior art keywords
simulation model
model validation
validation circuit
circuit
simulation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9709529A
Other languages
English (en)
Other versions
FR2766275A1 (fr
Inventor
Stephane Hanriat
Jean Pierre Schoellkopf
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SA
Original Assignee
SGS Thomson Microelectronics SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SGS Thomson Microelectronics SA filed Critical SGS Thomson Microelectronics SA
Priority to FR9709529A priority Critical patent/FR2766275B1/fr
Priority to US09/119,424 priority patent/US6253352B1/en
Publication of FR2766275A1 publication Critical patent/FR2766275A1/fr
Application granted granted Critical
Publication of FR2766275B1 publication Critical patent/FR2766275B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3016—Delay or race condition test, e.g. race hazard test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
FR9709529A 1997-07-21 1997-07-21 Circuit de validation de modeles de simulation Expired - Fee Related FR2766275B1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR9709529A FR2766275B1 (fr) 1997-07-21 1997-07-21 Circuit de validation de modeles de simulation
US09/119,424 US6253352B1 (en) 1997-07-21 1998-07-20 Circuit for validating simulation models

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9709529A FR2766275B1 (fr) 1997-07-21 1997-07-21 Circuit de validation de modeles de simulation

Publications (2)

Publication Number Publication Date
FR2766275A1 FR2766275A1 (fr) 1999-01-22
FR2766275B1 true FR2766275B1 (fr) 1999-10-15

Family

ID=9509667

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9709529A Expired - Fee Related FR2766275B1 (fr) 1997-07-21 1997-07-21 Circuit de validation de modeles de simulation

Country Status (2)

Country Link
US (1) US6253352B1 (fr)
FR (1) FR2766275B1 (fr)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB9925659D0 (en) * 1999-10-29 1999-12-29 Sgs Thomson Microelectronics A method of verification
US6883858B2 (en) * 2002-09-10 2005-04-26 L & L Products, Inc. Structural reinforcement member and method of use therefor
US6954916B2 (en) * 2003-06-30 2005-10-11 International Business Machines Corporation Methodology for fixing Qcrit at design timing impact
US7679458B2 (en) * 2005-12-06 2010-03-16 Qualcomm, Incorporated Ring oscillator for determining select-to-output delay of a multiplexer
US8661385B1 (en) * 2007-09-07 2014-02-25 Altera Corporation Method and apparatus for performing delay annotation
US11146251B2 (en) * 2020-03-06 2021-10-12 International Business Machines Corporation Performance-screen ring oscillator with switchable features

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4458165A (en) * 1983-03-23 1984-07-03 Tektronix, Inc. Programmable delay circuit
US4737670A (en) * 1984-11-09 1988-04-12 Lsi Logic Corporation Delay control circuit
US4712061A (en) * 1986-02-24 1987-12-08 Gould Inc. Small propagation delay measurement for digital logic
US4782283A (en) * 1986-08-22 1988-11-01 Aida Corporation Apparatus for scan testing CMOS integrated systems
US5083299A (en) * 1990-07-16 1992-01-21 Unisys Corporation Tester for measuring signal propagation delay through electronic components
US5121003A (en) * 1990-10-10 1992-06-09 Hal Computer Systems, Inc. Zero overhead self-timed iterative logic
US5355097A (en) * 1992-09-11 1994-10-11 Cypress Semiconductor Corporation Potentiometric oscillator with reset and test input
US5428626A (en) * 1993-10-18 1995-06-27 Tektronix, Inc. Timing analyzer for embedded testing
US5561692A (en) * 1993-12-09 1996-10-01 Northern Telecom Limited Clock phase shifting method and apparatus
US5570294A (en) * 1994-03-11 1996-10-29 Advanced Micro Devices Circuit configuration employing a compare unit for testing variably controlled delay units
US5471176A (en) * 1994-06-07 1995-11-28 Quantum Corporation Glitchless frequency-adjustable ring oscillator
US5731725A (en) * 1995-12-15 1998-03-24 Unisys Corporation Precision delay circuit
US5594690A (en) * 1995-12-15 1997-01-14 Unisys Corporation Integrated circuit memory having high speed and low power by selectively coupling compensation components to a pulse generator
JP3564855B2 (ja) * 1996-02-29 2004-09-15 ソニー株式会社 リングオシレータ及びｐｌｌ回路
US5811983A (en) * 1996-09-03 1998-09-22 Integrated Device Technology, Inc. Test ring oscillator
US5920211A (en) * 1997-03-27 1999-07-06 Lsi Logic Corporation Fully digital clock synthesizer

Also Published As

Publication number Publication date
US6253352B1 (en) 2001-06-26
FR2766275A1 (fr) 1999-01-22

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Legal Events

Date Code Title Description
CD Change of name or company name
ST Notification of lapse

Effective date: 20070330