FR2747474B1 - PORTABLE TESTER FOR SEMICONDUCTOR POWER COMPONENTS AND THEIR PROTECTIVE ELEMENTS - Google Patents

PORTABLE TESTER FOR SEMICONDUCTOR POWER COMPONENTS AND THEIR PROTECTIVE ELEMENTS

Info

Publication number
FR2747474B1
FR2747474B1 FR9604817A FR9604817A FR2747474B1 FR 2747474 B1 FR2747474 B1 FR 2747474B1 FR 9604817 A FR9604817 A FR 9604817A FR 9604817 A FR9604817 A FR 9604817A FR 2747474 B1 FR2747474 B1 FR 2747474B1
Authority
FR
France
Prior art keywords
semiconductor power
power components
protective elements
portable tester
tester
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9604817A
Other languages
French (fr)
Other versions
FR2747474A1 (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to FR9604817A priority Critical patent/FR2747474B1/en
Publication of FR2747474A1 publication Critical patent/FR2747474A1/en
Application granted granted Critical
Publication of FR2747474B1 publication Critical patent/FR2747474B1/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
FR9604817A 1996-04-12 1996-04-12 PORTABLE TESTER FOR SEMICONDUCTOR POWER COMPONENTS AND THEIR PROTECTIVE ELEMENTS Expired - Fee Related FR2747474B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR9604817A FR2747474B1 (en) 1996-04-12 1996-04-12 PORTABLE TESTER FOR SEMICONDUCTOR POWER COMPONENTS AND THEIR PROTECTIVE ELEMENTS

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9604817A FR2747474B1 (en) 1996-04-12 1996-04-12 PORTABLE TESTER FOR SEMICONDUCTOR POWER COMPONENTS AND THEIR PROTECTIVE ELEMENTS

Publications (2)

Publication Number Publication Date
FR2747474A1 FR2747474A1 (en) 1997-10-17
FR2747474B1 true FR2747474B1 (en) 1998-05-07

Family

ID=9491303

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9604817A Expired - Fee Related FR2747474B1 (en) 1996-04-12 1996-04-12 PORTABLE TESTER FOR SEMICONDUCTOR POWER COMPONENTS AND THEIR PROTECTIVE ELEMENTS

Country Status (1)

Country Link
FR (1) FR2747474B1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101398450B (en) * 2007-09-25 2012-07-04 中国人民解放军海军电磁兼容研究检测中心 Electric network peak transmission test device

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101975915B (en) * 2010-09-20 2013-12-18 中国电力科学研究院 Current interrupt protection test method for direct current converter valve thyristor

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0048324A1 (en) * 1980-09-24 1982-03-31 Walter Hanselmann AG Fesy Elektronik Apparatus for testing active semiconductive components
US4434401A (en) * 1981-05-04 1984-02-28 Flight Systems, Inc. Apparatus for testing semiconductor devices and capacitors
JPS5875073A (en) * 1981-10-29 1983-05-06 Yokogawa Hewlett Packard Ltd Dc characteristic measuring system
US5604426A (en) * 1993-06-30 1997-02-18 Asahi Glass Company Ltd. Electric apparatus with a power supply including an electric double layer capacitor

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101398450B (en) * 2007-09-25 2012-07-04 中国人民解放军海军电磁兼容研究检测中心 Electric network peak transmission test device

Also Published As

Publication number Publication date
FR2747474A1 (en) 1997-10-17

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20111230