FR2729498B1 - - Google Patents

Info

Publication number
FR2729498B1
FR2729498B1 FR9500565A FR9500565A FR2729498B1 FR 2729498 B1 FR2729498 B1 FR 2729498B1 FR 9500565 A FR9500565 A FR 9500565A FR 9500565 A FR9500565 A FR 9500565A FR 2729498 B1 FR2729498 B1 FR 2729498B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9500565A
Other languages
French (fr)
Other versions
FR2729498A1 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to FR9500565A priority Critical patent/FR2729498A1/en
Publication of FR2729498A1 publication Critical patent/FR2729498A1/en
Application granted granted Critical
Publication of FR2729498B1 publication Critical patent/FR2729498B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50—Marginal testing, e.g. race, voltage or current testing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/005—Circuit means for protection against loss of information of semiconductor storage devices
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50—Marginal testing, e.g. race, voltage or current testing
    • G11C2029/5002—Characteristic
FR9500565A 1995-01-17 1995-01-17 Semiconductor memory irradiation threshold determn. method for electronic system with e.g. SRAM Granted FR2729498A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR9500565A FR2729498A1 (en) 1995-01-17 1995-01-17 Semiconductor memory irradiation threshold determn. method for electronic system with e.g. SRAM

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9500565A FR2729498A1 (en) 1995-01-17 1995-01-17 Semiconductor memory irradiation threshold determn. method for electronic system with e.g. SRAM

Publications (2)

Publication Number Publication Date
FR2729498A1 FR2729498A1 (en) 1996-07-19
FR2729498B1 true FR2729498B1 (en) 1997-03-07

Family

ID=9475274

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9500565A Granted FR2729498A1 (en) 1995-01-17 1995-01-17 Semiconductor memory irradiation threshold determn. method for electronic system with e.g. SRAM

Country Status (1)

Country Link
FR (1) FR2729498A1 (en)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5157335A (en) * 1989-08-18 1992-10-20 Houston Theodore W On-chip error detection circuit
EP0601392A3 (en) * 1992-12-08 1995-07-12 Siemens Ag Method of testing the crosstalk behaviour of digital memories.

Also Published As

Publication number Publication date
FR2729498A1 (en) 1996-07-19

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Legal Events

Date Code Title Description
ST Notification of lapse