FR2725288B3 - DESIGN AND TESTING OF ELECTRONIC SYSTEMS - Google Patents

DESIGN AND TESTING OF ELECTRONIC SYSTEMS

Info

Publication number
FR2725288B3
FR2725288B3 FR9511321A FR9511321A FR2725288B3 FR 2725288 B3 FR2725288 B3 FR 2725288B3 FR 9511321 A FR9511321 A FR 9511321A FR 9511321 A FR9511321 A FR 9511321A FR 2725288 B3 FR2725288 B3 FR 2725288B3
Authority
FR
France
Prior art keywords
testing
design
electronic systems
electronic
systems
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
FR9511321A
Other languages
French (fr)
Other versions
FR2725288A3 (en
Inventor
Maurice Whelan
Lionel Barker
Joseph Knox
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Electronics NV filed Critical Philips Electronics NV
Publication of FR2725288A3 publication Critical patent/FR2725288A3/en
Application granted granted Critical
Publication of FR2725288B3 publication Critical patent/FR2725288B3/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2273Test methods
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834Automated test systems [ATE]; using microprocessors or computers
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26Functional testing
    • G06F11/261Functional testing by simulating additional hardware, e.g. fault simulation

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
  • Structure Of Printed Boards (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Debugging And Monitoring (AREA)
FR9511321A 1994-09-30 1995-09-27 DESIGN AND TESTING OF ELECTRONIC SYSTEMS Expired - Lifetime FR2725288B3 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IES940793 IES940793A2 (en) 1994-09-30 1994-09-30 Design and testing of electronic systems

Publications (2)

Publication Number Publication Date
FR2725288A3 FR2725288A3 (en) 1996-04-05
FR2725288B3 true FR2725288B3 (en) 1996-12-13

Family

ID=11040535

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9511321A Expired - Lifetime FR2725288B3 (en) 1994-09-30 1995-09-27 DESIGN AND TESTING OF ELECTRONIC SYSTEMS

Country Status (4)

Country Link
DE (1) DE29515429U1 (en)
FR (1) FR2725288B3 (en)
GB (1) GB9519746D0 (en)
IE (1) IES940793A2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101986280A (en) * 2010-11-29 2011-03-16 浙江大学 Automatic testing platform for virtual computing system

Also Published As

Publication number Publication date
IES62316B2 (en) 1995-01-25
DE29515429U1 (en) 1996-05-02
FR2725288A3 (en) 1996-04-05
GB9519746D0 (en) 1995-11-29
IES940793A2 (en) 1995-01-25

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Legal Events

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