FR2696548B1 - Source de rayons X, procédé de réalisation de cette source et application à des diffractomètres. - Google Patents

Source de rayons X, procédé de réalisation de cette source et application à des diffractomètres.

Info

Publication number
FR2696548B1
FR2696548B1 FR9212096A FR9212096A FR2696548B1 FR 2696548 B1 FR2696548 B1 FR 2696548B1 FR 9212096 A FR9212096 A FR 9212096A FR 9212096 A FR9212096 A FR 9212096A FR 2696548 B1 FR2696548 B1 FR 2696548B1
Authority
FR
France
Prior art keywords
source
diffractometers
producing
application
ray source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9212096A
Other languages
English (en)
Other versions
FR2696548A1 (fr
Inventor
Fabien Cesbron
Jacques Lespagnol
Roger Thomas
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre National dEtudes Spatiales CNES
Centre National de la Recherche Scientifique CNRS
Original Assignee
Centre National dEtudes Spatiales CNES
Centre National de la Recherche Scientifique CNRS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre National dEtudes Spatiales CNES, Centre National de la Recherche Scientifique CNRS filed Critical Centre National dEtudes Spatiales CNES
Priority to FR9212096A priority Critical patent/FR2696548B1/fr
Publication of FR2696548A1 publication Critical patent/FR2696548A1/fr
Application granted granted Critical
Publication of FR2696548B1 publication Critical patent/FR2696548B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/20—Sources of radiation
    • G01N2223/202—Sources of radiation isotopes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR9212096A 1992-10-01 1992-10-01 Source de rayons X, procédé de réalisation de cette source et application à des diffractomètres. Expired - Fee Related FR2696548B1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR9212096A FR2696548B1 (fr) 1992-10-01 1992-10-01 Source de rayons X, procédé de réalisation de cette source et application à des diffractomètres.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9212096A FR2696548B1 (fr) 1992-10-01 1992-10-01 Source de rayons X, procédé de réalisation de cette source et application à des diffractomètres.

Publications (2)

Publication Number Publication Date
FR2696548A1 FR2696548A1 (fr) 1994-04-08
FR2696548B1 true FR2696548B1 (fr) 1994-12-16

Family

ID=9434382

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9212096A Expired - Fee Related FR2696548B1 (fr) 1992-10-01 1992-10-01 Source de rayons X, procédé de réalisation de cette source et application à des diffractomètres.

Country Status (1)

Country Link
FR (1) FR2696548B1 (fr)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU682030A1 (ru) * 1977-03-25 1982-06-23 Danilin L D Радиоизотопный источник
SU972351A1 (ru) * 1981-01-20 1982-11-07 Объединенный Институт Ядерных Исследований Двухступенчатый источник рентгеновского излучени

Also Published As

Publication number Publication date
FR2696548A1 (fr) 1994-04-08

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Legal Events

Date Code Title Description
ST Notification of lapse