FR2684208B1 - CIRCUIT FOR PROVIDING PERIOD INFORMATION. - Google Patents

CIRCUIT FOR PROVIDING PERIOD INFORMATION.

Info

Publication number
FR2684208B1
FR2684208B1 FR9210363A FR9210363A FR2684208B1 FR 2684208 B1 FR2684208 B1 FR 2684208B1 FR 9210363 A FR9210363 A FR 9210363A FR 9210363 A FR9210363 A FR 9210363A FR 2684208 B1 FR2684208 B1 FR 2684208B1
Authority
FR
France
Prior art keywords
circuit
period information
providing period
providing
information
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9210363A
Other languages
French (fr)
Other versions
FR2684208A1 (en
Inventor
Addison Reichert Peter
Joseph Brown Benjamin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US07/605,977 external-priority patent/US5321700A/en
Application filed by Teradyne Inc filed Critical Teradyne Inc
Priority to FR9210363A priority Critical patent/FR2684208B1/en
Publication of FR2684208A1 publication Critical patent/FR2684208A1/en
Application granted granted Critical
Publication of FR2684208B1 publication Critical patent/FR2684208B1/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/02—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31928—Formatter
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/10—Complex mathematical operations
    • G06F17/17—Function evaluation by approximation methods, e.g. inter- or extrapolation, smoothing, least mean square method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G01R31/3191—Calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
FR9210363A 1990-10-30 1992-08-28 CIRCUIT FOR PROVIDING PERIOD INFORMATION. Expired - Fee Related FR2684208B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR9210363A FR2684208B1 (en) 1990-10-30 1992-08-28 CIRCUIT FOR PROVIDING PERIOD INFORMATION.

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/605,977 US5321700A (en) 1989-10-11 1990-10-30 High speed timing generator
FR9210363A FR2684208B1 (en) 1990-10-30 1992-08-28 CIRCUIT FOR PROVIDING PERIOD INFORMATION.

Publications (2)

Publication Number Publication Date
FR2684208A1 FR2684208A1 (en) 1993-05-28
FR2684208B1 true FR2684208B1 (en) 1995-01-27

Family

ID=26229683

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9210363A Expired - Fee Related FR2684208B1 (en) 1990-10-30 1992-08-28 CIRCUIT FOR PROVIDING PERIOD INFORMATION.

Country Status (1)

Country Link
FR (1) FR2684208B1 (en)

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4730318A (en) * 1986-11-24 1988-03-08 International Business Machines Corporation Modular organized storage tester
US4779221A (en) * 1987-01-28 1988-10-18 Megatest Corporation Timing signal generator
JP2719684B2 (en) * 1988-05-23 1998-02-25 株式会社アドバンテスト Delay generator

Also Published As

Publication number Publication date
FR2684208A1 (en) 1993-05-28

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20070629