FR2641379B1 - Procede de controle d'une tranche de silicium autosoudee - Google Patents
Procede de controle d'une tranche de silicium autosoudeeInfo
- Publication number
- FR2641379B1 FR2641379B1 FR8817398A FR8817398A FR2641379B1 FR 2641379 B1 FR2641379 B1 FR 2641379B1 FR 8817398 A FR8817398 A FR 8817398A FR 8817398 A FR8817398 A FR 8817398A FR 2641379 B1 FR2641379 B1 FR 2641379B1
- Authority
- FR
- France
- Prior art keywords
- self
- controlling
- silicon wafer
- welded silicon
- welded
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title 1
- 229910052710 silicon Inorganic materials 0.000 title 1
- 239000010703 silicon Substances 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/72—Investigating presence of flaws
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR8817398A FR2641379B1 (fr) | 1988-12-29 | 1988-12-29 | Procede de controle d'une tranche de silicium autosoudee |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR8817398A FR2641379B1 (fr) | 1988-12-29 | 1988-12-29 | Procede de controle d'une tranche de silicium autosoudee |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2641379A1 FR2641379A1 (fr) | 1990-07-06 |
FR2641379B1 true FR2641379B1 (fr) | 1991-11-29 |
Family
ID=9373571
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR8817398A Expired - Lifetime FR2641379B1 (fr) | 1988-12-29 | 1988-12-29 | Procede de controle d'une tranche de silicium autosoudee |
Country Status (1)
Country | Link |
---|---|
FR (1) | FR2641379B1 (fr) |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3206603A (en) * | 1962-08-16 | 1965-09-14 | Gen Electric | Infrared flaw detector method and apparatus |
US3405270A (en) * | 1965-08-06 | 1968-10-08 | Western Electric Co | Internal flaw detection using collimated beams |
US3681970A (en) * | 1970-03-09 | 1972-08-08 | G C Optronics Inc | Method of flaw detection using internal heating |
IL65176A0 (en) * | 1982-03-05 | 1982-05-31 | C I Ltd | Material testing method and apparatus |
GB2164147A (en) * | 1984-09-04 | 1986-03-12 | Gen Electric | Detection of coating adhesion |
-
1988
- 1988-12-29 FR FR8817398A patent/FR2641379B1/fr not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
FR2641379A1 (fr) | 1990-07-06 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |