FR2602361B1 - ACTIVE MATRIX DISPLAY SCREEN WITHOUT INTERFERENCE TRANSISTOR AND MANUFACTURING METHOD THEREOF - Google Patents

ACTIVE MATRIX DISPLAY SCREEN WITHOUT INTERFERENCE TRANSISTOR AND MANUFACTURING METHOD THEREOF

Info

Publication number
FR2602361B1
FR2602361B1 FR8610618A FR8610618A FR2602361B1 FR 2602361 B1 FR2602361 B1 FR 2602361B1 FR 8610618 A FR8610618 A FR 8610618A FR 8610618 A FR8610618 A FR 8610618A FR 2602361 B1 FR2602361 B1 FR 2602361B1
Authority
FR
France
Prior art keywords
manufacturing
display screen
active matrix
matrix display
interference transistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8610618A
Other languages
French (fr)
Other versions
FR2602361A1 (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from FR868601083A external-priority patent/FR2593631B1/en
Application filed by Individual filed Critical Individual
Priority to FR8610618A priority Critical patent/FR2602361B1/en
Publication of FR2602361A1 publication Critical patent/FR2602361A1/en
Application granted granted Critical
Publication of FR2602361B1 publication Critical patent/FR2602361B1/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
    • H01L29/40—Electrodes ; Multistep manufacturing processes therefor
    • H01L29/43—Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
    • H01L29/435—Resistive materials for field effect devices, e.g. resistive gate for MOSFET or MESFET
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/1368—Active matrix addressed cells in which the switching element is a three-electrode device
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
    • H01L29/40—Electrodes ; Multistep manufacturing processes therefor
    • H01L29/41—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions
    • H01L29/417—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions carrying the current to be rectified, amplified or switched
    • H01L29/41725—Source or drain electrodes for field effect devices
    • H01L29/41733—Source or drain electrodes for field effect devices for thin film transistors with insulated gate
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
    • H01L29/40—Electrodes ; Multistep manufacturing processes therefor
    • H01L29/41—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions
    • H01L29/423—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions not carrying the current to be rectified, amplified or switched
    • H01L29/42312—Gate electrodes for field effect devices
    • H01L29/42316—Gate electrodes for field effect devices for field-effect transistors
    • H01L29/4232—Gate electrodes for field effect devices for field-effect transistors with insulated gate
    • H01L29/42384—Gate electrodes for field effect devices for field-effect transistors with insulated gate for thin film field effect transistors, e.g. characterised by the thickness or the shape of the insulator or the dimensions, the shape or the lay-out of the conductor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
    • H01L29/40—Electrodes ; Multistep manufacturing processes therefor
    • H01L29/43—Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
    • H01L29/49—Metal-insulator-semiconductor electrodes, e.g. gates of MOSFET
    • H01L29/4908—Metal-insulator-semiconductor electrodes, e.g. gates of MOSFET for thin film semiconductor, e.g. gate of TFT
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F2202/00—Materials and properties
    • G02F2202/10—Materials and properties semiconductor
    • G02F2202/103—Materials and properties semiconductor a-Si

Landscapes

  • Microelectronics & Electronic Packaging (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Nonlinear Science (AREA)
  • Optics & Photonics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Mathematical Physics (AREA)
  • Thin Film Transistor (AREA)
FR8610618A 1986-01-27 1986-07-22 ACTIVE MATRIX DISPLAY SCREEN WITHOUT INTERFERENCE TRANSISTOR AND MANUFACTURING METHOD THEREOF Expired FR2602361B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR8610618A FR2602361B1 (en) 1986-01-27 1986-07-22 ACTIVE MATRIX DISPLAY SCREEN WITHOUT INTERFERENCE TRANSISTOR AND MANUFACTURING METHOD THEREOF

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR868601083A FR2593631B1 (en) 1986-01-27 1986-01-27 GRID RESISTANT ACTIVE MATRIX DISPLAY SCREEN AND METHODS OF MAKING SAME
FR8610618A FR2602361B1 (en) 1986-01-27 1986-07-22 ACTIVE MATRIX DISPLAY SCREEN WITHOUT INTERFERENCE TRANSISTOR AND MANUFACTURING METHOD THEREOF

Publications (2)

Publication Number Publication Date
FR2602361A1 FR2602361A1 (en) 1988-02-05
FR2602361B1 true FR2602361B1 (en) 1989-05-19

Family

ID=26224986

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8610618A Expired FR2602361B1 (en) 1986-01-27 1986-07-22 ACTIVE MATRIX DISPLAY SCREEN WITHOUT INTERFERENCE TRANSISTOR AND MANUFACTURING METHOD THEREOF

Country Status (1)

Country Link
FR (1) FR2602361B1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4965646A (en) * 1988-10-21 1990-10-23 General Electric Company Thin film transistor and crossover structure for liquid crystal displays
US5994174A (en) * 1997-09-29 1999-11-30 The Regents Of The University Of California Method of fabrication of display pixels driven by silicon thin film transistors
US6157048A (en) * 1998-08-05 2000-12-05 U.S. Philips Corporation Thin film transistors with elongated coiled electrodes, and large area devices containing such transistors

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2533072B1 (en) * 1982-09-14 1986-07-18 Coissard Pierre METHOD FOR MANUFACTURING ELECTRONIC CIRCUITS BASED ON THIN FILM TRANSISTORS AND CAPACITORS
JPS60189969A (en) * 1984-03-12 1985-09-27 Matsushita Electric Ind Co Ltd Thin film transistor

Also Published As

Publication number Publication date
FR2602361A1 (en) 1988-02-05

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Legal Events

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TP Transmission of property
TP Transmission of property
TP Transmission of property
ST Notification of lapse