FR2589578B1 - METHOD AND DEVICE FOR OPTICAL CONTROL BY REFLECTION OF A SEMI-TRANSPARENT MATERIAL OR COMPONENT - Google Patents

METHOD AND DEVICE FOR OPTICAL CONTROL BY REFLECTION OF A SEMI-TRANSPARENT MATERIAL OR COMPONENT

Info

Publication number
FR2589578B1
FR2589578B1 FR8516385A FR8516385A FR2589578B1 FR 2589578 B1 FR2589578 B1 FR 2589578B1 FR 8516385 A FR8516385 A FR 8516385A FR 8516385 A FR8516385 A FR 8516385A FR 2589578 B1 FR2589578 B1 FR 2589578B1
Authority
FR
France
Prior art keywords
reflection
semi
component
transparent material
optical control
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8516385A
Other languages
French (fr)
Other versions
FR2589578A1 (en
Inventor
Michel Egee
Christian Jean Eugene Bissieux
Jean Louis Beaudoin
Jean Raymond Delmas
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Universite de Reims Champagne Ardenne URCA
Original Assignee
Universite de Reims Champagne Ardenne URCA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Universite de Reims Champagne Ardenne URCA filed Critical Universite de Reims Champagne Ardenne URCA
Priority to FR8516385A priority Critical patent/FR2589578B1/en
Publication of FR2589578A1 publication Critical patent/FR2589578A1/en
Application granted granted Critical
Publication of FR2589578B1 publication Critical patent/FR2589578B1/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/359—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using near infrared light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
FR8516385A 1985-11-05 1985-11-05 METHOD AND DEVICE FOR OPTICAL CONTROL BY REFLECTION OF A SEMI-TRANSPARENT MATERIAL OR COMPONENT Expired FR2589578B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR8516385A FR2589578B1 (en) 1985-11-05 1985-11-05 METHOD AND DEVICE FOR OPTICAL CONTROL BY REFLECTION OF A SEMI-TRANSPARENT MATERIAL OR COMPONENT

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8516385A FR2589578B1 (en) 1985-11-05 1985-11-05 METHOD AND DEVICE FOR OPTICAL CONTROL BY REFLECTION OF A SEMI-TRANSPARENT MATERIAL OR COMPONENT

Publications (2)

Publication Number Publication Date
FR2589578A1 FR2589578A1 (en) 1987-05-07
FR2589578B1 true FR2589578B1 (en) 1988-02-05

Family

ID=9324519

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8516385A Expired FR2589578B1 (en) 1985-11-05 1985-11-05 METHOD AND DEVICE FOR OPTICAL CONTROL BY REFLECTION OF A SEMI-TRANSPARENT MATERIAL OR COMPONENT

Country Status (1)

Country Link
FR (1) FR2589578B1 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0413943A1 (en) * 1989-08-14 1991-02-27 Hughes Aircraft Company Non-contact on-line determination of phosphate layer thickness and composition of a phosphate coated surface
US5289266A (en) * 1989-08-14 1994-02-22 Hughes Aircraft Company Noncontact, on-line determination of phosphate layer thickness and composition of a phosphate coated surface
FR2716531B1 (en) * 1994-02-18 1996-05-03 Saint Gobain Cinematique Contr Method for measuring the thickness of a transparent material.
US6188079B1 (en) * 1999-01-12 2001-02-13 Owens-Brockway Glass Container Inc. Measurement of hot container wall thickness
DE19928171B4 (en) * 1999-06-19 2011-01-05 Leybold Optics Gmbh Method for continuously determining the optical layer thickness of coatings
IT202000017836A1 (en) * 2020-07-23 2022-01-23 Fameccanica Data Spa PROCEDURE AND APPARATUS FOR IN-LINE ANALYSIS OF A COMPOSITE PRODUCT IN A MACHINE FOR THE PRODUCTION OF ABSORBENT SANITARY GOODS

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4085326A (en) * 1976-10-19 1978-04-18 Industrial Nucleonics Corporation Radiation reflection method and apparatus particularly for gauging materials exhibiting broadband absorption or scattering, or similar effects

Also Published As

Publication number Publication date
FR2589578A1 (en) 1987-05-07

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Legal Events

Date Code Title Description
ST Notification of lapse