FR2574935B1 - Appareil optique de recherche de defauts, en particulier sur bandes textiles non tissees - Google Patents

Appareil optique de recherche de defauts, en particulier sur bandes textiles non tissees

Info

Publication number
FR2574935B1
FR2574935B1 FR8518780A FR8518780A FR2574935B1 FR 2574935 B1 FR2574935 B1 FR 2574935B1 FR 8518780 A FR8518780 A FR 8518780A FR 8518780 A FR8518780 A FR 8518780A FR 2574935 B1 FR2574935 B1 FR 2574935B1
Authority
FR
France
Prior art keywords
nonwoven textile
finding apparatus
fault finding
optical fault
stripes
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8518780A
Other languages
English (en)
Other versions
FR2574935A1 (fr
Inventor
Erwin Sick
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Erwin Sick GmbH Optik Elektronik
Original Assignee
Erwin Sick GmbH Optik Elektronik
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Erwin Sick GmbH Optik Elektronik filed Critical Erwin Sick GmbH Optik Elektronik
Publication of FR2574935A1 publication Critical patent/FR2574935A1/fr
Application granted granted Critical
Publication of FR2574935B1 publication Critical patent/FR2574935B1/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
FR8518780A 1984-12-19 1985-12-18 Appareil optique de recherche de defauts, en particulier sur bandes textiles non tissees Expired FR2574935B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE3446355A DE3446355C2 (de) 1984-12-19 1984-12-19 Optisches Fehlersuchgerät

Publications (2)

Publication Number Publication Date
FR2574935A1 FR2574935A1 (fr) 1986-06-20
FR2574935B1 true FR2574935B1 (fr) 1988-11-25

Family

ID=6253233

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8518780A Expired FR2574935B1 (fr) 1984-12-19 1985-12-18 Appareil optique de recherche de defauts, en particulier sur bandes textiles non tissees

Country Status (4)

Country Link
US (1) US4671663A (fr)
DE (1) DE3446355C2 (fr)
FR (1) FR2574935B1 (fr)
GB (1) GB2171511B (fr)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3719766A1 (de) * 1987-06-13 1988-12-22 Heidelberger Druckmasch Ag Registermesssystem
DE3734294A1 (de) * 1987-10-09 1989-04-27 Sick Optik Elektronik Erwin Optische oberflaechen-inspektionsvorrichtung
US5278635A (en) * 1990-03-28 1994-01-11 Konica Corporation Surface defect detection apparatus
US5047652A (en) * 1990-04-16 1991-09-10 International Paper Company System for on-line measurement of color, opacity and reflectance of a translucent moving web
US5293538A (en) * 1990-05-25 1994-03-08 Hitachi, Ltd. Method and apparatus for the inspection of defects
US5488480A (en) * 1994-02-16 1996-01-30 Cmd Corporation Apparatus and method for detecting a heat seal in a moving plastic film
US5861078A (en) * 1993-08-12 1999-01-19 Cmd Corporation Method and apparatus for detecting a seal on a plastic bag
AUPN800796A0 (en) * 1996-02-09 1996-03-07 Unisearch Limited Visual inspection system for leather hide
GB9614073D0 (en) * 1996-07-04 1996-09-04 Surface Inspection Ltd Visual inspection apparatus
US6075882A (en) * 1997-06-18 2000-06-13 Philip Morris Incorporated System and method for optically inspecting cigarettes by detecting the lengths of cigarette sections
US5966218A (en) * 1997-07-11 1999-10-12 Philip Morris Incorporated Bobbin optical inspection system
US6020969A (en) * 1997-07-11 2000-02-01 Philip Morris Incorporated Cigarette making machine including band inspection
US6198537B1 (en) 1997-07-11 2001-03-06 Philip Morris Incorporated Optical inspection system for the manufacture of banded cigarette paper
GB9819614D0 (en) * 1998-09-09 1998-11-04 Stylios George Method and apparatus for assessment of seam pucker and other surface irregularities
IL131284A (en) * 1999-08-05 2003-05-29 Orbotech Ltd Illumination for inspecting surfaces of articles
US6668231B2 (en) 2001-04-12 2003-12-23 George Stylios Sheet parameter measurement
US7146034B2 (en) * 2003-12-09 2006-12-05 Superpower, Inc. Tape manufacturing system
US7272972B2 (en) * 2005-06-24 2007-09-25 Avestor Limited Partnership Method and apparatus for measuring a thickness of a thin film in motion
DE102006014506A1 (de) * 2006-03-20 2007-09-27 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren zur Detektion von Planlageabweichungen bei der Abrollung flexibler, bahnförmiger Flachformgüter
DE102013100809A1 (de) * 2013-01-28 2014-07-31 Von Ardenne Anlagentechnik Gmbh Verfahren zur Messung von optischen Eigenschaften an transparenten flexiblen Substraten
US9588056B2 (en) * 2014-05-29 2017-03-07 Corning Incorporated Method for particle detection on flexible substrates
RU2677054C1 (ru) * 2018-04-04 2019-01-15 Федеральное государственное бюджетное учреждение науки Конструкторско-технологический институт научного приборостроения Сибирского отделения Российской академии наук (КТИ НП СО РАН) Устройство для обнаружения поверхностных дефектов цилиндрических объектов

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB791058A (en) * 1955-03-02 1958-02-19 Pneumatic Scale Corp Container filling machine
US3330961A (en) * 1964-04-15 1967-07-11 Eastman Kodak Co Photoelectric skip detector for use with a viscous layer applicator
US3430055A (en) * 1965-04-02 1969-02-25 Bowles Eng Corp Surface flaw detector
BE668611A (fr) * 1965-04-28
US3675016A (en) * 1970-02-17 1972-07-04 Eastman Kodak Co Flying spot scanning
GB1383320A (en) * 1971-08-19 1974-02-12 British Iron Steel Research Measurement of the shape of strip material
JPS5149234B2 (fr) * 1971-08-31 1976-12-25
GB1462875A (en) * 1973-05-16 1977-01-26 Ciba Geigy Ag Method of scanning a surface
DE2404972A1 (de) * 1974-02-01 1975-08-07 Ciba Geigy Ag Vorrichtung zur ermittlung von fehlstellen auf der oberflaeche eines bewegten reflektierenden materials
GB1484996A (en) * 1974-09-06 1977-09-08 United Biscuits Ltd Measurement of the position of a surface
JPS5849819B2 (ja) * 1975-03-18 1983-11-07 コニカ株式会社 ソウサシキケンサソウチ
GB1540066A (en) * 1975-07-25 1979-02-07 Nash P Optical inspection systems
DE2727926C3 (de) * 1977-06-21 1980-11-13 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Vorrichtung zur Ermittlung von Fehlstellen auf der reflektierenden Oberfläche einer Bahn
US4326804A (en) * 1980-02-11 1982-04-27 General Electric Company Apparatus and method for optical clearance determination
JPS58219441A (ja) * 1982-06-15 1983-12-20 Hajime Sangyo Kk 凸面体の表面欠陥検査装置
DE3472300D1 (en) * 1983-04-22 1988-07-28 Sick Optik Elektronik Erwin Device for the detection of faults
DE3337251A1 (de) * 1983-10-13 1985-04-25 Gerd Dipl.-Phys. Dr. 8520 Erlangen Häusler Optisches abtastverfahren zur dreidimensionalen vermessung von objekten

Also Published As

Publication number Publication date
US4671663A (en) 1987-06-09
DE3446355A1 (de) 1986-06-26
GB8530571D0 (en) 1986-01-22
FR2574935A1 (fr) 1986-06-20
GB2171511B (en) 1989-03-30
GB2171511A (en) 1986-08-28
DE3446355C2 (de) 1986-11-06

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Legal Events

Date Code Title Description
ST Notification of lapse