FR2566140B1 - Dispositif d'analyse et de correction de surfaces d'onde en temps reel a interferometre a polarisation - Google Patents

Dispositif d'analyse et de correction de surfaces d'onde en temps reel a interferometre a polarisation

Info

Publication number
FR2566140B1
FR2566140B1 FR8409425A FR8409425A FR2566140B1 FR 2566140 B1 FR2566140 B1 FR 2566140B1 FR 8409425 A FR8409425 A FR 8409425A FR 8409425 A FR8409425 A FR 8409425A FR 2566140 B1 FR2566140 B1 FR 2566140B1
Authority
FR
France
Prior art keywords
analyzing
time wave
wave surfaces
polarized interferometer
correcting real
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8409425A
Other languages
English (en)
Other versions
FR2566140A1 (fr
Inventor
Michel Philbert
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Office National dEtudes et de Recherches Aerospatiales ONERA
Original Assignee
Office National dEtudes et de Recherches Aerospatiales ONERA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Office National dEtudes et de Recherches Aerospatiales ONERA filed Critical Office National dEtudes et de Recherches Aerospatiales ONERA
Priority to FR8409425A priority Critical patent/FR2566140B1/fr
Priority to DE8585401109T priority patent/DE3576999D1/de
Priority to EP85401109A priority patent/EP0165173B1/fr
Priority to US06/743,609 priority patent/US4688941A/en
Priority to JP60129182A priority patent/JPS6117921A/ja
Publication of FR2566140A1 publication Critical patent/FR2566140A1/fr
Application granted granted Critical
Publication of FR2566140B1 publication Critical patent/FR2566140B1/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G01J2009/0261—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods polarised

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
FR8409425A 1984-06-15 1984-06-15 Dispositif d'analyse et de correction de surfaces d'onde en temps reel a interferometre a polarisation Expired FR2566140B1 (fr)

Priority Applications (5)

Application Number Priority Date Filing Date Title
FR8409425A FR2566140B1 (fr) 1984-06-15 1984-06-15 Dispositif d'analyse et de correction de surfaces d'onde en temps reel a interferometre a polarisation
DE8585401109T DE3576999D1 (de) 1984-06-15 1985-06-05 Vorrichtung zur echtzeit-ausmessung und -korrektur von wellenflaechen unter verwendung eines polarisationsinterferometers.
EP85401109A EP0165173B1 (fr) 1984-06-15 1985-06-05 Dispositif pour l'analyse et la correction de surfaces d'onde en temps réel utilisant un inteféromètre à polarisation
US06/743,609 US4688941A (en) 1984-06-15 1985-06-11 Device for analyzing and correcting wavefront surfaces in real time using a polarization interferometer
JP60129182A JPS6117921A (ja) 1984-06-15 1985-06-15 実時間波頭解析修正装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8409425A FR2566140B1 (fr) 1984-06-15 1984-06-15 Dispositif d'analyse et de correction de surfaces d'onde en temps reel a interferometre a polarisation

Publications (2)

Publication Number Publication Date
FR2566140A1 FR2566140A1 (fr) 1985-12-20
FR2566140B1 true FR2566140B1 (fr) 1986-09-05

Family

ID=9305085

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8409425A Expired FR2566140B1 (fr) 1984-06-15 1984-06-15 Dispositif d'analyse et de correction de surfaces d'onde en temps reel a interferometre a polarisation

Country Status (5)

Country Link
US (1) US4688941A (fr)
EP (1) EP0165173B1 (fr)
JP (1) JPS6117921A (fr)
DE (1) DE3576999D1 (fr)
FR (1) FR2566140B1 (fr)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4946280A (en) * 1988-09-15 1990-08-07 Massachusetts Institute Of Technology Wavefront analysis for segmented mirror control
US5018861A (en) * 1989-06-22 1991-05-28 Quantametrics Inc. Methods and means for full-surface interferometric testing of grazing incidence mirrors
US5159498A (en) * 1990-03-01 1992-10-27 The Charles Stark Draper Laboratory, Inc. Active mirror assembly
CN1036292C (zh) * 1992-09-17 1997-10-29 清华大学 双频激光准直测量方法及其准直测量干涉仪
US5980513A (en) 1994-04-25 1999-11-09 Autonomous Technologies Corp. Laser beam delivery and eye tracking system
US6271914B1 (en) * 1996-11-25 2001-08-07 Autonomous Technologies Corporation Objective measurement and correction of optical systems using wavefront analysis
US20010041884A1 (en) * 1996-11-25 2001-11-15 Frey Rudolph W. Method for determining and correcting vision
US6598975B2 (en) * 1998-08-19 2003-07-29 Alcon, Inc. Apparatus and method for measuring vision defects of a human eye
WO2000010448A1 (fr) 1998-08-19 2000-03-02 Autonomous Technologies Corporation Dispositif de mesure des defauts de la vision chez l'homme et methode afferente
BR0105551A (pt) 2000-03-22 2002-03-05 Alcon Universal Ltd Otimização de correção por ablação de um sistema ótico e métodos associados
US7044944B2 (en) * 2000-03-22 2006-05-16 Alcon Refractivehorizons, Inc. Optimization of ablation correction of an optical system and associated methods
ATE380498T1 (de) * 2000-04-19 2007-12-15 Alcon Refractive Horizons Inc Methode für augenregistrierungskontrolle
US6929638B2 (en) * 2000-04-19 2005-08-16 Alcon Refractivehorizons, Inc. Eye registration and astigmatism alignment control systems and method
AR031570A1 (es) 2000-04-19 2003-09-24 Alcon Inc Aparato sensor de frentes de onda
US6599286B2 (en) 2000-04-25 2003-07-29 Alcon Universal Ltd. Laser ablation zone restriction system and method
US6460997B1 (en) 2000-05-08 2002-10-08 Alcon Universal Ltd. Apparatus and method for objective measurements of optical systems using wavefront analysis
US7013183B1 (en) * 2000-07-14 2006-03-14 Solvisions Technologies Int'l Multiplexer hardware and software for control of a deformable mirror
US6639683B1 (en) * 2000-10-17 2003-10-28 Remy Tumbar Interferometric sensor and method to detect optical fields
US7226443B1 (en) 2003-11-07 2007-06-05 Alcon Refractivehorizons, Inc. Optimization of ablation correction of an optical system and associated methods
CN108168835B (zh) * 2018-02-09 2024-04-09 中国空气动力研究与发展中心超高速空气动力研究所 一种风洞双光程纹影流场显示装置
CN112465705B (zh) * 2020-12-08 2022-08-19 福州大学 基于两孔径旋转双棱镜的视场扩大系统及方法
CN114136466B (zh) * 2021-11-24 2023-11-28 西安工业大学 一种实现瞬时两步相移的横向剪切干涉测量装置及方法
CN114136465B (zh) * 2021-11-24 2023-10-31 西安工业大学 一种瞬时两步相移横向剪切干涉测量系统和方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2070474A5 (fr) * 1969-12-05 1971-09-10 Anvar
JPS54656B1 (fr) * 1971-06-18 1979-01-13
US3923400A (en) * 1974-01-03 1975-12-02 Itek Corp Real-time wavefront correction system
US4003658A (en) * 1974-07-26 1977-01-18 The United States Of America As Represented By The Secretary Of The Air Force Triangular interferometric light-source tracker
US4072422A (en) * 1975-10-27 1978-02-07 Canon Kabushiki Kaisha Apparatus for interferometrically measuring the physical properties of test object

Also Published As

Publication number Publication date
JPS6117921A (ja) 1986-01-25
US4688941A (en) 1987-08-25
FR2566140A1 (fr) 1985-12-20
DE3576999D1 (de) 1990-05-10
EP0165173B1 (fr) 1990-04-04
EP0165173A3 (en) 1987-04-29
EP0165173A2 (fr) 1985-12-18

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Legal Events

Date Code Title Description
ST Notification of lapse