FR2555758B1 - Appareil de mesure de caracteristiques statiques de transistors et de diodes - Google Patents

Appareil de mesure de caracteristiques statiques de transistors et de diodes

Info

Publication number
FR2555758B1
FR2555758B1 FR8318858A FR8318858A FR2555758B1 FR 2555758 B1 FR2555758 B1 FR 2555758B1 FR 8318858 A FR8318858 A FR 8318858A FR 8318858 A FR8318858 A FR 8318858A FR 2555758 B1 FR2555758 B1 FR 2555758B1
Authority
FR
France
Prior art keywords
diodes
transistors
static characteristics
measuring static
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8318858A
Other languages
English (en)
Other versions
FR2555758A1 (fr
Inventor
Jean-Marie Fougnion
Jean-Luc Gautier
Daniel Pasquet
Pierre Pouvil
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ECOLE NALE SUP ELECTRO APPLICA
Original Assignee
ECOLE NALE SUP ELECTRO APPLICA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ECOLE NALE SUP ELECTRO APPLICA filed Critical ECOLE NALE SUP ELECTRO APPLICA
Priority to FR8318858A priority Critical patent/FR2555758B1/fr
Publication of FR2555758A1 publication Critical patent/FR2555758A1/fr
Application granted granted Critical
Publication of FR2555758B1 publication Critical patent/FR2555758B1/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
FR8318858A 1983-11-25 1983-11-25 Appareil de mesure de caracteristiques statiques de transistors et de diodes Expired FR2555758B1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR8318858A FR2555758B1 (fr) 1983-11-25 1983-11-25 Appareil de mesure de caracteristiques statiques de transistors et de diodes

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8318858A FR2555758B1 (fr) 1983-11-25 1983-11-25 Appareil de mesure de caracteristiques statiques de transistors et de diodes

Publications (2)

Publication Number Publication Date
FR2555758A1 FR2555758A1 (fr) 1985-05-31
FR2555758B1 true FR2555758B1 (fr) 1986-09-26

Family

ID=9294549

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8318858A Expired FR2555758B1 (fr) 1983-11-25 1983-11-25 Appareil de mesure de caracteristiques statiques de transistors et de diodes

Country Status (1)

Country Link
FR (1) FR2555758B1 (fr)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL8502385A (nl) * 1984-10-04 1986-05-01 Sony Tektronix Corp Inrichting voor het meten van de karakteristieken van elektronische inrichtingen.
CN101738540B (zh) * 2009-11-04 2012-06-13 中国科学院长春光学精密机械与物理研究所 一种自动测量电接口静态特性的方法

Also Published As

Publication number Publication date
FR2555758A1 (fr) 1985-05-31

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Legal Events

Date Code Title Description
ST Notification of lapse