FR2540994B1 - DEVICE FOR ESTABLISHING ELECTRICAL CONTACTS ON A VARIABLE TEMPERATURE CIRCUIT - Google Patents

DEVICE FOR ESTABLISHING ELECTRICAL CONTACTS ON A VARIABLE TEMPERATURE CIRCUIT

Info

Publication number
FR2540994B1
FR2540994B1 FR8302495A FR8302495A FR2540994B1 FR 2540994 B1 FR2540994 B1 FR 2540994B1 FR 8302495 A FR8302495 A FR 8302495A FR 8302495 A FR8302495 A FR 8302495A FR 2540994 B1 FR2540994 B1 FR 2540994B1
Authority
FR
France
Prior art keywords
electrical contacts
variable temperature
establishing electrical
temperature circuit
establishing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8302495A
Other languages
French (fr)
Other versions
FR2540994A1 (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Priority to FR8302495A priority Critical patent/FR2540994B1/en
Publication of FR2540994A1 publication Critical patent/FR2540994A1/en
Application granted granted Critical
Publication of FR2540994B1 publication Critical patent/FR2540994B1/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2642Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
FR8302495A 1983-02-16 1983-02-16 DEVICE FOR ESTABLISHING ELECTRICAL CONTACTS ON A VARIABLE TEMPERATURE CIRCUIT Expired FR2540994B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR8302495A FR2540994B1 (en) 1983-02-16 1983-02-16 DEVICE FOR ESTABLISHING ELECTRICAL CONTACTS ON A VARIABLE TEMPERATURE CIRCUIT

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8302495A FR2540994B1 (en) 1983-02-16 1983-02-16 DEVICE FOR ESTABLISHING ELECTRICAL CONTACTS ON A VARIABLE TEMPERATURE CIRCUIT

Publications (2)

Publication Number Publication Date
FR2540994A1 FR2540994A1 (en) 1984-08-17
FR2540994B1 true FR2540994B1 (en) 1985-10-11

Family

ID=9285973

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8302495A Expired FR2540994B1 (en) 1983-02-16 1983-02-16 DEVICE FOR ESTABLISHING ELECTRICAL CONTACTS ON A VARIABLE TEMPERATURE CIRCUIT

Country Status (1)

Country Link
FR (1) FR2540994B1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4787752A (en) * 1986-10-24 1988-11-29 Fts Systems, Inc. Live component temperature conditioning device providing fast temperature variations

Also Published As

Publication number Publication date
FR2540994A1 (en) 1984-08-17

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Legal Events

Date Code Title Description
ST Notification of lapse