FR2514903B1 - - Google Patents

Info

Publication number
FR2514903B1
FR2514903B1 FR8120096A FR8120096A FR2514903B1 FR 2514903 B1 FR2514903 B1 FR 2514903B1 FR 8120096 A FR8120096 A FR 8120096A FR 8120096 A FR8120096 A FR 8120096A FR 2514903 B1 FR2514903 B1 FR 2514903B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8120096A
Other languages
French (fr)
Other versions
FR2514903A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre National de la Recherche Scientifique CNRS
Original Assignee
Centre National de la Recherche Scientifique CNRS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre National de la Recherche Scientifique CNRS filed Critical Centre National de la Recherche Scientifique CNRS
Priority to FR8120096A priority Critical patent/FR2514903A1/fr
Publication of FR2514903A1 publication Critical patent/FR2514903A1/fr
Application granted granted Critical
Publication of FR2514903B1 publication Critical patent/FR2514903B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2637—Circuits therefor for testing other individual devices
    • G01R31/2639—Circuits therefor for testing other individual devices for testing field-effect devices, e.g. of MOS-capacitors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
FR8120096A 1981-10-21 1981-10-21 Dispositif de mesure d'une impedance Granted FR2514903A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR8120096A FR2514903A1 (fr) 1981-10-21 1981-10-21 Dispositif de mesure d'une impedance

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8120096A FR2514903A1 (fr) 1981-10-21 1981-10-21 Dispositif de mesure d'une impedance

Publications (2)

Publication Number Publication Date
FR2514903A1 FR2514903A1 (fr) 1983-04-22
FR2514903B1 true FR2514903B1 (enExample) 1984-01-06

Family

ID=9263402

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8120096A Granted FR2514903A1 (fr) 1981-10-21 1981-10-21 Dispositif de mesure d'une impedance

Country Status (1)

Country Link
FR (1) FR2514903A1 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2674636B1 (fr) * 1991-03-29 1994-07-29 Commissariat Energie Atomique Procede et dispositif de qualification d'un systeme capacitif.
FR2675585B1 (fr) * 1991-04-22 1993-08-27 Aerospatiale Procede et dispositif de mesure et de controle de l'isolement electrique d'un systeme actif.

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1068314A (fr) * 1952-12-15 1954-06-24 Lignes Telegraph Telephon Dispositif pour la sélection de redresseurs intervenant dans les modulateurs
HU181136B (en) * 1980-06-07 1983-06-28 Mta Mueszaki Fiz Kutato Inteze Method and instrument for measuring change in transient capacity of semiconducting elements

Also Published As

Publication number Publication date
FR2514903A1 (fr) 1983-04-22

Similar Documents

Publication Publication Date Title
FR2503754B1 (enExample)
FR2501271B1 (enExample)
FR2499315B1 (enExample)
IN153073B (enExample)
FR2499734B1 (enExample)
FR2498218B1 (enExample)
FR2504017B1 (enExample)
GR75494B (enExample)
DE3278610T2 (enExample)
FR2499718B1 (enExample)
FR2500406B1 (enExample)
FR2504274B1 (enExample)
FR2500467B1 (enExample)
FR2499980B1 (enExample)
FR2501266B1 (enExample)
FR2499921B1 (enExample)
FR2500459B1 (enExample)
FR2498139B1 (enExample)
FR2503846B1 (enExample)
FR2498077B3 (enExample)
FR2501369B1 (enExample)
FR2499552B1 (enExample)
FR2503263B1 (enExample)
FR2502222B1 (enExample)
FR2504016B1 (enExample)

Legal Events

Date Code Title Description
ST Notification of lapse