FR2501867B1 - - Google Patents

Info

Publication number
FR2501867B1
FR2501867B1 FR8104868A FR8104868A FR2501867B1 FR 2501867 B1 FR2501867 B1 FR 2501867B1 FR 8104868 A FR8104868 A FR 8104868A FR 8104868 A FR8104868 A FR 8104868A FR 2501867 B1 FR2501867 B1 FR 2501867B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8104868A
Other languages
French (fr)
Other versions
FR2501867A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Priority to FR8104868A priority Critical patent/FR2501867A1/fr
Priority to DE8282400377T priority patent/DE3262367D1/de
Priority to EP82400377A priority patent/EP0060194B1/fr
Priority to US06/355,094 priority patent/US4520309A/en
Priority to JP57038830A priority patent/JPS57161565A/ja
Publication of FR2501867A1 publication Critical patent/FR2501867A1/fr
Application granted granted Critical
Publication of FR2501867B1 publication Critical patent/FR2501867B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Logic Circuits (AREA)
FR8104868A 1981-03-11 1981-03-11 Systeme de test de la defaillance ou du bon fonctionnement d'un circuit a composants logiques Granted FR2501867A1 (fr)

Priority Applications (5)

Application Number Priority Date Filing Date Title
FR8104868A FR2501867A1 (fr) 1981-03-11 1981-03-11 Systeme de test de la defaillance ou du bon fonctionnement d'un circuit a composants logiques
DE8282400377T DE3262367D1 (en) 1981-03-11 1982-03-04 System for testing failure or good functioning of a circuit consisting of logic components
EP82400377A EP0060194B1 (fr) 1981-03-11 1982-03-04 Système de test de la défaillance ou du bon fonctionnement d'un circuit à composants logiques
US06/355,094 US4520309A (en) 1981-03-11 1982-03-05 System for testing the malfunctioning or correct operation of a circuit with logic components
JP57038830A JPS57161565A (en) 1981-03-11 1982-03-11 System for testing malfunctioning or normal functioning of logic circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8104868A FR2501867A1 (fr) 1981-03-11 1981-03-11 Systeme de test de la defaillance ou du bon fonctionnement d'un circuit a composants logiques

Publications (2)

Publication Number Publication Date
FR2501867A1 FR2501867A1 (fr) 1982-09-17
FR2501867B1 true FR2501867B1 (en:Method) 1983-04-15

Family

ID=9256112

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8104868A Granted FR2501867A1 (fr) 1981-03-11 1981-03-11 Systeme de test de la defaillance ou du bon fonctionnement d'un circuit a composants logiques

Country Status (5)

Country Link
US (1) US4520309A (en:Method)
EP (1) EP0060194B1 (en:Method)
JP (1) JPS57161565A (en:Method)
DE (1) DE3262367D1 (en:Method)
FR (1) FR2501867A1 (en:Method)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2568015B1 (fr) * 1984-07-18 1986-08-08 Commissariat Energie Atomique Systeme de test de la defaillance ou du bon fonctionnement d'un circuit a composants logiques
FR2626422B1 (fr) * 1988-01-27 1994-04-15 Elf Aquitaine Ste Nale Circuit logique a structure programmable, procede de cablage d'un arbre et dispositif de mise en oeuvre du procede de cablage

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3815025A (en) * 1971-10-18 1974-06-04 Ibm Large-scale integrated circuit testing structure
US3790885A (en) * 1972-03-27 1974-02-05 Ibm Serial test patterns for mosfet testing
US3777129A (en) * 1972-05-22 1973-12-04 Gte Automatic Electric Lab Inc Fault detection and localization in digital systems
US3789205A (en) * 1972-09-28 1974-01-29 Ibm Method of testing mosfet planar boards
US3842346A (en) * 1972-12-20 1974-10-15 C Bobbitt Continuity testing of solid state circuitry during temperature cycling
US3881260A (en) * 1973-07-05 1975-05-06 James M Hombs Self-teaching machine for binary logic
US3924181A (en) * 1973-10-16 1975-12-02 Hughes Aircraft Co Test circuitry employing a cyclic code generator
US3927371A (en) * 1974-02-19 1975-12-16 Ibm Test system for large scale integrated circuits
US3961250A (en) * 1974-05-08 1976-06-01 International Business Machines Corporation Logic network test system with simulator oriented fault test generator
US4013951A (en) * 1974-08-02 1977-03-22 Nissan Motor Co., Ltd. Circuit testing apparatus
US4222514A (en) * 1978-11-30 1980-09-16 Sperry Corporation Digital tester
US4308616A (en) * 1979-05-29 1981-12-29 Timoc Constantin C Structure for physical fault simulation of digital logic

Also Published As

Publication number Publication date
FR2501867A1 (fr) 1982-09-17
EP0060194B1 (fr) 1985-02-20
EP0060194A1 (fr) 1982-09-15
US4520309A (en) 1985-05-28
JPH0213750B2 (en:Method) 1990-04-05
DE3262367D1 (en) 1985-03-28
JPS57161565A (en) 1982-10-05

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Legal Events

Date Code Title Description
ST Notification of lapse