FR2500925B1 - - Google Patents

Info

Publication number
FR2500925B1
FR2500925B1 FR8104128A FR8104128A FR2500925B1 FR 2500925 B1 FR2500925 B1 FR 2500925B1 FR 8104128 A FR8104128 A FR 8104128A FR 8104128 A FR8104128 A FR 8104128A FR 2500925 B1 FR2500925 B1 FR 2500925B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8104128A
Other languages
French (fr)
Other versions
FR2500925A1 (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ATELIER OUTILLAGE ORLEANAIS SA
Original Assignee
ATELIER OUTILLAGE ORLEANAIS SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ATELIER OUTILLAGE ORLEANAIS SA filed Critical ATELIER OUTILLAGE ORLEANAIS SA
Priority to FR8104128A priority Critical patent/FR2500925A1/en
Publication of FR2500925A1 publication Critical patent/FR2500925A1/en
Application granted granted Critical
Publication of FR2500925B1 publication Critical patent/FR2500925B1/fr
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/0008Apparatus or processes for manufacturing printed circuits for aligning or positioning of tools relative to the circuit board
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302Contactless testing
    • G01R31/308Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/309Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08Monitoring manufacture of assemblages
    • H05K13/081Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/05Patterning and lithography; Masks; Details of resist
    • H05K2203/0548Masks
    • H05K2203/056Using an artwork, i.e. a photomask for exposing photosensitive layers
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/0011Working of insulating substrates or insulating layers
    • H05K3/0044Mechanical working of the substrate, e.g. drilling or punching
    • H05K3/0047Drilling of holes
FR8104128A 1981-03-02 1981-03-02 Automatic hole drilling controller and monitor - uses microprocessor controlled scanning by light beam and diode array of test piece advanced through beam by stepping drive Granted FR2500925A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR8104128A FR2500925A1 (en) 1981-03-02 1981-03-02 Automatic hole drilling controller and monitor - uses microprocessor controlled scanning by light beam and diode array of test piece advanced through beam by stepping drive

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8104128A FR2500925A1 (en) 1981-03-02 1981-03-02 Automatic hole drilling controller and monitor - uses microprocessor controlled scanning by light beam and diode array of test piece advanced through beam by stepping drive

Publications (2)

Publication Number Publication Date
FR2500925A1 FR2500925A1 (en) 1982-09-03
FR2500925B1 true FR2500925B1 (en) 1985-05-17

Family

ID=9255773

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8104128A Granted FR2500925A1 (en) 1981-03-02 1981-03-02 Automatic hole drilling controller and monitor - uses microprocessor controlled scanning by light beam and diode array of test piece advanced through beam by stepping drive

Country Status (1)

Country Link
FR (1) FR2500925A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1992009883A1 (en) * 1990-11-30 1992-06-11 International Business Machines Corporation Method and system for verifying substrate machining

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2549676A1 (en) * 1983-07-19 1985-01-25 Basset Frederic Method and device for computer-aided determination of the drilling coordinates of printed-circuit plans.

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4040748A (en) * 1975-06-30 1977-08-09 International Business Machines Corporation Inspection tool
FR2321229A1 (en) * 1975-08-13 1977-03-11 Cit Alcatel METHOD AND APPARATUS FOR AUTOMATIC GRAPHIC CONTROL
FR2430017A1 (en) * 1978-06-30 1980-01-25 Maurel Roger Printed circuit metallised holes automatic tester - employs reference board to provide hole coordinates for microprocessor
US4240750A (en) * 1978-10-02 1980-12-23 Hurd William A Automatic circuit board tester
DE2929846A1 (en) * 1979-07-23 1981-03-12 Siemens AG, 1000 Berlin und 8000 München OPTO-ELECTRONIC TESTING SYSTEM FOR AUTOMATIC CHECKING OF CHARACTERISTICS, THEIR INTERMEDIATE PRODUCTS AND PRINTING TOOLS

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1992009883A1 (en) * 1990-11-30 1992-06-11 International Business Machines Corporation Method and system for verifying substrate machining

Also Published As

Publication number Publication date
FR2500925A1 (en) 1982-09-03

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Legal Events

Date Code Title Description
ST Notification of lapse