FR2497340B1 - Appareil a jauge extensometrique en film mince muni de resistances de compensation de la temperature, non contraintes - Google Patents

Appareil a jauge extensometrique en film mince muni de resistances de compensation de la temperature, non contraintes

Info

Publication number
FR2497340B1
FR2497340B1 FR8027666A FR8027666A FR2497340B1 FR 2497340 B1 FR2497340 B1 FR 2497340B1 FR 8027666 A FR8027666 A FR 8027666A FR 8027666 A FR8027666 A FR 8027666A FR 2497340 B1 FR2497340 B1 FR 2497340B1
Authority
FR
France
Prior art keywords
unstrained
thin film
temperature compensation
compensation resistors
gauge apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8027666A
Other languages
English (en)
Other versions
FR2497340A1 (fr
Inventor
Donald J Koneval
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Gould Inc
Original Assignee
Gould Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gould Inc filed Critical Gould Inc
Priority to FR8027666A priority Critical patent/FR2497340B1/fr
Publication of FR2497340A1 publication Critical patent/FR2497340A1/fr
Application granted granted Critical
Publication of FR2497340B1 publication Critical patent/FR2497340B1/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
    • G01L1/2268—Arrangements for correcting or for compensating unwanted effects
    • G01L1/2281—Arrangements for correcting or for compensating unwanted effects for temperature variations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/16—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge
    • G01B7/18—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge using change in resistance
    • G01B7/20—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge using change in resistance formed by printed-circuit technique

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Force In General (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
FR8027666A 1980-12-29 1980-12-29 Appareil a jauge extensometrique en film mince muni de resistances de compensation de la temperature, non contraintes Expired FR2497340B1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR8027666A FR2497340B1 (fr) 1980-12-29 1980-12-29 Appareil a jauge extensometrique en film mince muni de resistances de compensation de la temperature, non contraintes

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8027666A FR2497340B1 (fr) 1980-12-29 1980-12-29 Appareil a jauge extensometrique en film mince muni de resistances de compensation de la temperature, non contraintes

Publications (2)

Publication Number Publication Date
FR2497340A1 FR2497340A1 (fr) 1982-07-02
FR2497340B1 true FR2497340B1 (fr) 1986-04-25

Family

ID=9249555

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8027666A Expired FR2497340B1 (fr) 1980-12-29 1980-12-29 Appareil a jauge extensometrique en film mince muni de resistances de compensation de la temperature, non contraintes

Country Status (1)

Country Link
FR (1) FR2497340B1 (fr)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2545605B1 (fr) * 1983-05-03 1985-10-11 Sedeme Dispositif de mesure a jauges de contrainte, notamment pour la mesure de pression
EP3771895B1 (fr) * 2019-07-31 2023-11-01 ABB Schweiz AG Mesures de jauge de contrainte à température compensée

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2350972A (en) * 1939-09-16 1944-06-06 Arthur C Ruge Strain gauge
US2930224A (en) * 1956-10-22 1960-03-29 Lockheed Aircraft Corp Temperature compensating strain gage
US3034346A (en) * 1960-12-01 1962-05-15 Budd Co Compensation of strain gauge transducer non-linearity
US3303693A (en) * 1964-03-23 1967-02-14 Statham Instrument Inc Arm type film bridge with minimal thermal zero shift
US3808469A (en) * 1972-10-27 1974-04-30 Bell & Howell Co Temperature compensation circuit for sensor of physical variables such as temperature and pressure
US4104607A (en) * 1977-03-14 1978-08-01 The United States Of America As Represented By The Secretary Of The Navy Zero temperature coefficient of resistance bi-film resistor
EP0053337B1 (fr) * 1980-11-29 1987-05-20 Tokyo Electric Co., Ltd. Cellule de mesure de charge et procédé pour sa manufacture

Also Published As

Publication number Publication date
FR2497340A1 (fr) 1982-07-02

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Legal Events

Date Code Title Description
ST Notification of lapse