FR2417895B1 - DEVICE FOR ERROR-FREE TRANSMISSION OF MULTIPLE OUTPUT SIGNALS AS A FUNCTION OF A VARIABLE ELECTRICAL SIZE - Google Patents

DEVICE FOR ERROR-FREE TRANSMISSION OF MULTIPLE OUTPUT SIGNALS AS A FUNCTION OF A VARIABLE ELECTRICAL SIZE

Info

Publication number
FR2417895B1
FR2417895B1 FR7904033A FR7904033A FR2417895B1 FR 2417895 B1 FR2417895 B1 FR 2417895B1 FR 7904033 A FR7904033 A FR 7904033A FR 7904033 A FR7904033 A FR 7904033A FR 2417895 B1 FR2417895 B1 FR 2417895B1
Authority
FR
France
Prior art keywords
error
function
output signals
multiple output
free transmission
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7904033A
Other languages
French (fr)
Other versions
FR2417895A1 (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hasler AG
Original Assignee
Hasler AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hasler AG filed Critical Hasler AG
Publication of FR2417895A1 publication Critical patent/FR2417895A1/en
Application granted granted Critical
Publication of FR2417895B1 publication Critical patent/FR2417895B1/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2827—Testing of electronic protection circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Train Traffic Observation, Control, And Security (AREA)
FR7904033A 1978-02-17 1979-02-16 DEVICE FOR ERROR-FREE TRANSMISSION OF MULTIPLE OUTPUT SIGNALS AS A FUNCTION OF A VARIABLE ELECTRICAL SIZE Expired FR2417895B1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH173778A CH632858A5 (en) 1978-02-17 1978-02-17 One-fault intrinsically safe switching device

Publications (2)

Publication Number Publication Date
FR2417895A1 FR2417895A1 (en) 1979-09-14
FR2417895B1 true FR2417895B1 (en) 1986-10-31

Family

ID=4217400

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7904033A Expired FR2417895B1 (en) 1978-02-17 1979-02-16 DEVICE FOR ERROR-FREE TRANSMISSION OF MULTIPLE OUTPUT SIGNALS AS A FUNCTION OF A VARIABLE ELECTRICAL SIZE

Country Status (3)

Country Link
CH (1) CH632858A5 (en)
DE (1) DE2903370A1 (en)
FR (1) FR2417895B1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3235870A1 (en) * 1982-09-28 1984-03-29 Siemens AG, 1000 Berlin und 8000 München Circuit arrangement for a processor-controlled test device which can be connected via interfaces to a system to be tested, for example a telephone switching system

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3448449A (en) * 1965-08-25 1969-06-03 Bendix Corp Automatic test device
JPS502129B1 (en) * 1970-09-02 1975-01-23
DE2142711C3 (en) * 1971-08-26 1975-07-10 Bodenseewerk Geraetetechnik Gmbh, 7770 Ueberlingen Signal test circuit for signals for which certain tolerance ranges are specified
DE2621068B2 (en) * 1976-05-12 1980-09-18 Gkss-Forschungszentrum Geesthacht Gmbh, 2000 Hamburg Device for monitoring the difference between at least three input variables

Also Published As

Publication number Publication date
DE2903370A1 (en) 1979-08-30
FR2417895A1 (en) 1979-09-14
CH632858A5 (en) 1982-10-29

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Legal Events

Date Code Title Description
ST Notification of lapse