FR2372434B1 - - Google Patents

Info

Publication number
FR2372434B1
FR2372434B1 FR7735679A FR7735679A FR2372434B1 FR 2372434 B1 FR2372434 B1 FR 2372434B1 FR 7735679 A FR7735679 A FR 7735679A FR 7735679 A FR7735679 A FR 7735679A FR 2372434 B1 FR2372434 B1 FR 2372434B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7735679A
Other versions
FR2372434A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Publication of FR2372434A1 publication Critical patent/FR2372434A1/fr
Application granted granted Critical
Publication of FR2372434B1 publication Critical patent/FR2372434B1/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor
    • G01R13/24—Time-base deflection circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/002—Testing or calibrating of apparatus covered by the other groups of this subclass of cathode ray oscilloscopes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Controls And Circuits For Display Device (AREA)
  • Measurement Of Unknown Time Intervals (AREA)
  • Details Of Television Scanning (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
FR7735679A 1976-11-24 1977-11-22 Expired FR2372434B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/744,559 US4105932A (en) 1976-11-24 1976-11-24 "Slewed pulse" scope sweep calibrator

Publications (2)

Publication Number Publication Date
FR2372434A1 FR2372434A1 (fr) 1978-06-23
FR2372434B1 true FR2372434B1 (fr) 1980-06-06

Family

ID=24993157

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7735679A Expired FR2372434B1 (fr) 1976-11-24 1977-11-22

Country Status (7)

Country Link
US (1) US4105932A (fr)
JP (1) JPS5366270A (fr)
CA (1) CA1090420A (fr)
DE (1) DE2752551C3 (fr)
FR (1) FR2372434B1 (fr)
GB (1) GB1542170A (fr)
NL (1) NL181237C (fr)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4338569A (en) * 1980-03-11 1982-07-06 Control Data Corporation Delay lock loop
JPS5980922U (ja) * 1982-11-25 1984-05-31 日本発条株式会社 ステアリングホイル用ホ−ンスイツチ装置
US4581585A (en) * 1983-02-07 1986-04-08 Tektronix, Inc. Apparatus and method for automatically calibrating a sweep waveform generator
JPS62176013A (ja) * 1985-12-18 1987-08-01 新光電気工業株式会社 スイツチ用クリツクばね
US4868514A (en) * 1987-11-17 1989-09-19 International Business Machines Corporation Apparatus and method for digital compensation of oscillator drift
US4855968A (en) * 1988-06-30 1989-08-08 Tektronix, Inc. Time interval measurement system for analog oscilloscope
US4982387A (en) * 1989-08-28 1991-01-01 Tektronix, Inc. Digital time base with differential period delay
EP0582622A4 (en) * 1991-04-03 1996-03-06 Magni Systems Inc Adaptive graticule in a raster displayed waveform monitor
GB9809450D0 (en) * 1998-05-01 1998-07-01 Wandel & Goltermann Limited Jitter measurement
JP6542188B2 (ja) * 2016-12-27 2019-07-10 シーエル計測工業株式会社 対象物検出センサ

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2438420A (en) * 1941-09-18 1948-03-23 Vickers Electrical Co Ltd Calibration of cathode-ray oscillographs
US2504852A (en) * 1947-02-21 1950-04-18 Hazeltine Research Inc Measuring system, including an electronically traced vernier scale
US3076120A (en) * 1956-07-25 1963-01-29 Decca Ltd Radar displays
GB1100655A (en) * 1965-09-20 1968-01-24 Marconi Instruments Ltd Improvements in or relating to cathode ray tube display oscilloscope instruments
NL6516536A (fr) * 1965-12-18 1967-06-19
US3500115A (en) * 1968-06-10 1970-03-10 Gen Electric Electronic graticule for cathode ray tubes
US3909671A (en) * 1970-07-23 1975-09-30 Naohisa Nakaya Sampling oscilloscope having means for magnifying a part of an observed wave form along the time base
US3881133A (en) * 1973-06-18 1975-04-29 Tektronix Inc Two dot indicator system

Also Published As

Publication number Publication date
DE2752551A1 (de) 1978-06-01
JPS5366270A (en) 1978-06-13
FR2372434A1 (fr) 1978-06-23
NL181237B (nl) 1987-02-02
US4105932A (en) 1978-08-08
CA1090420A (fr) 1980-11-25
DE2752551B2 (de) 1980-02-21
JPS5626823B2 (fr) 1981-06-20
NL181237C (nl) 1987-07-01
NL7712816A (nl) 1978-05-26
GB1542170A (en) 1979-03-14
DE2752551C3 (de) 1980-10-30

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Legal Events

Date Code Title Description
ST Notification of lapse