FR2263499B1 - - Google Patents

Info

Publication number
FR2263499B1
FR2263499B1 FR7407218A FR7407218A FR2263499B1 FR 2263499 B1 FR2263499 B1 FR 2263499B1 FR 7407218 A FR7407218 A FR 7407218A FR 7407218 A FR7407218 A FR 7407218A FR 2263499 B1 FR2263499 B1 FR 2263499B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7407218A
Other languages
French (fr)
Other versions
FR2263499A1 (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Radiotechnique Compelec RTC SA
Original Assignee
Radiotechnique Compelec RTC SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Radiotechnique Compelec RTC SA filed Critical Radiotechnique Compelec RTC SA
Priority to FR7407218A priority Critical patent/FR2263499A1/fr
Publication of FR2263499A1 publication Critical patent/FR2263499A1/fr
Application granted granted Critical
Publication of FR2263499B1 publication Critical patent/FR2263499B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2608—Circuits therefor for testing bipolar transistors
    • G01R31/2619—Circuits therefor for testing bipolar transistors for measuring thermal properties thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/01—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
FR7407218A 1974-03-04 1974-03-04 Method of measuring transistor junction temp. - has constant current generator between collector and emitter Granted FR2263499A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR7407218A FR2263499A1 (en) 1974-03-04 1974-03-04 Method of measuring transistor junction temp. - has constant current generator between collector and emitter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7407218A FR2263499A1 (en) 1974-03-04 1974-03-04 Method of measuring transistor junction temp. - has constant current generator between collector and emitter

Publications (2)

Publication Number Publication Date
FR2263499A1 FR2263499A1 (en) 1975-10-03
FR2263499B1 true FR2263499B1 (enrdf_load_html_response) 1976-06-25

Family

ID=9135757

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7407218A Granted FR2263499A1 (en) 1974-03-04 1974-03-04 Method of measuring transistor junction temp. - has constant current generator between collector and emitter

Country Status (1)

Country Link
FR (1) FR2263499A1 (enrdf_load_html_response)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4764026A (en) * 1986-07-07 1988-08-16 Varian Associates, Inc. Semiconductor wafer temperature measuring device and method

Also Published As

Publication number Publication date
FR2263499A1 (en) 1975-10-03

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Legal Events

Date Code Title Description
CL Concession to grant licences
ST Notification of lapse