FR2255596B1 - - Google Patents

Info

Publication number
FR2255596B1
FR2255596B1 FR7442016A FR7442016A FR2255596B1 FR 2255596 B1 FR2255596 B1 FR 2255596B1 FR 7442016 A FR7442016 A FR 7442016A FR 7442016 A FR7442016 A FR 7442016A FR 2255596 B1 FR2255596 B1 FR 2255596B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7442016A
Other versions
FR2255596A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV
Publication of FR2255596A1 publication Critical patent/FR2255596A1/fr
Application granted granted Critical
Publication of FR2255596B1 publication Critical patent/FR2255596B1/fr
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/244—Detectors; Associated components or circuits therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
    • G01N23/2255—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident ion beams, e.g. proton beams
    • G01N23/2258—Measuring secondary ion emission, e.g. secondary ion mass spectrometry [SIMS]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J43/00—Secondary-emission tubes; Electron-multiplier tubes
    • H01J43/04—Electron multipliers
    • H01J43/06—Electrode arrangements
    • H01J43/18—Electrode arrangements using essentially more than one dynode
    • H01J43/24—Dynodes having potential gradient along their surfaces
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/28—Static spectrometers
    • H01J49/282—Static spectrometers using electrostatic analysers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
    • H01J49/46—Static spectrometers
    • H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
    • H01J49/482—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter with cylindrical mirrors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means
    • H01J2237/24435—Microchannel plates
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means
    • H01J2237/2449—Detector devices with moving charges in electric or magnetic fields
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/245—Detection characterised by the variable being measured
    • H01J2237/24507—Intensity, dose or other characteristics of particle beams or electromagnetic radiation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/245—Detection characterised by the variable being measured
    • H01J2237/24571—Measurements of non-electric or non-magnetic variables
    • H01J2237/24585—Other variables, e.g. energy, mass, velocity, time, temperature
FR7442016A 1973-12-20 1974-12-19 Expired FR2255596B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL7317436A NL7317436A (nl) 1973-12-20 1973-12-20 Inrichting voor massa-analyse en structuur-analyse van een oppervlaklaag door middel van ionenver- strooiing.

Publications (2)

Publication Number Publication Date
FR2255596A1 FR2255596A1 (fr) 1975-07-18
FR2255596B1 true FR2255596B1 (fr) 1978-12-22

Family

ID=19820233

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7442016A Expired FR2255596B1 (fr) 1973-12-20 1974-12-19

Country Status (7)

Country Link
US (1) US3970849A (fr)
JP (1) JPS5741066B2 (fr)
CA (1) CA1015467A (fr)
DE (1) DE2458025C2 (fr)
FR (1) FR2255596B1 (fr)
GB (1) GB1487960A (fr)
NL (1) NL7317436A (fr)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2856244A1 (de) * 1978-12-27 1980-07-03 Kernforschungsanlage Juelich Elektronenstosspektrometer
EP0058154A1 (fr) * 1980-05-12 1982-08-25 La Trobe University Spectrometre a resolution angulaire
DE3138990A1 (de) * 1981-09-30 1983-04-14 Siemens AG, 1000 Berlin und 8000 München Koaxiales gegenfeld-spektrometer hoher akzeptanz fuersekundaerelektronen und elektronenstrahl-messgeraet
FR2514557A1 (fr) * 1981-10-09 1983-04-15 Commissariat Energie Atomique Spectrometre magnetique miniature a structure coaxiale
DE3311195A1 (de) * 1983-03-26 1984-10-04 Kernforschungsanlage Jülich GmbH, 5170 Jülich Elektronenenergie-analysator mit vielkanaldetektor
GB8725459D0 (en) * 1987-10-30 1987-12-02 Nat Research Dev Corpn Generating particle beams
DE3803424C2 (de) * 1988-02-05 1995-05-18 Gsf Forschungszentrum Umwelt Verfahren zur quantitativen, tiefendifferentiellen Analyse fester Proben
JPH07120516B2 (ja) * 1990-07-26 1995-12-20 株式会社東芝 低エネルギ−電子の照射方法および照射装置
AU1273192A (en) * 1992-02-17 1993-09-03 Dca Instruments Oy Method in the electron spectroscopy and an electron spectrometer
US6794647B2 (en) 2003-02-25 2004-09-21 Beckman Coulter, Inc. Mass analyzer having improved mass filter and ion detection arrangement
US7186972B2 (en) * 2003-10-23 2007-03-06 Beckman Coulter, Inc. Time of flight mass analyzer having improved mass resolution and method of operating same
US6995365B2 (en) * 2003-11-12 2006-02-07 Beckman Coulter, Inc. Mass analyzer having improved ion selection unit
DE102004014582B4 (de) * 2004-03-25 2009-08-20 Bruker Daltonik Gmbh Ionenoptische Phasenvolumenkomprimierung
GB201011716D0 (en) 2010-07-13 2010-08-25 Shimadzu Corp Charged particle energy analysers and methods of operating charged particle energy analysers

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3480774A (en) * 1967-05-26 1969-11-25 Minnesota Mining & Mfg Low-energy ion scattering apparatus and method for analyzing the surface of a solid
US3621240A (en) * 1969-05-27 1971-11-16 Franklin Gro Corp Apparatus and methods for detecting and identifying trace gases
GB1327572A (en) * 1971-03-23 1973-08-22 Ass Elect Ind Apparatus for use in charged particle spectroscopy
US3786249A (en) * 1971-12-20 1974-01-15 Stanford Research Inst Negative ion duoplasmatron mass spectrometer for isotope ratio analysis

Also Published As

Publication number Publication date
DE2458025C2 (de) 1982-04-22
US3970849A (en) 1976-07-20
GB1487960A (en) 1977-10-05
DE2458025A1 (de) 1975-07-03
JPS5741066B2 (fr) 1982-09-01
FR2255596A1 (fr) 1975-07-18
CA1015467A (en) 1977-08-09
JPS5097391A (fr) 1975-08-02
NL7317436A (nl) 1975-06-24

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Legal Events

Date Code Title Description
ST Notification of lapse