FR2254992A5 - Solder testing machine for microcircuits - applies force to component using pincers operated from a tt toooorquemeter - Google Patents

Solder testing machine for microcircuits - applies force to component using pincers operated from a tt toooorquemeter

Info

Publication number
FR2254992A5
FR2254992A5 FR7345397A FR7345397A FR2254992A5 FR 2254992 A5 FR2254992 A5 FR 2254992A5 FR 7345397 A FR7345397 A FR 7345397A FR 7345397 A FR7345397 A FR 7345397A FR 2254992 A5 FR2254992 A5 FR 2254992A5
Authority
FR
France
Prior art keywords
pincers
component
toooorquemeter
microcircuits
operated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7345397A
Other languages
French (fr)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Compteurs Schlumberger SA
Original Assignee
Compteurs Schlumberger SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Compteurs Schlumberger SA filed Critical Compteurs Schlumberger SA
Priority to FR7345397A priority Critical patent/FR2254992A5/en
Application granted granted Critical
Publication of FR2254992A5 publication Critical patent/FR2254992A5/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67011—Apparatus for manufacture or treatment
    • H01L21/67138—Apparatus for wiring semiconductor or solid state device
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L5/00—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes
    • G01L5/0028—Force sensors associated with force applying means
    • G01L5/0033—Force sensors associated with force applying means applying a pulling force
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/026—Specifications of the specimen
    • G01N2203/0296—Welds

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Manipulator (AREA)

Abstract

The device comprises a vacuum table maintaining the component in position during the test, a component (6) for gripping the wire, and a unit which applies a force to the gripping component. The gripping component (6) is in the form of pincers or claws and the device which applies the force of these is a torquemeter (5). A single control device regulates the pincers and the torquemeter. The torquemeter comprises two rotating elements linked together by a spring, one of the elements forming the axis of rotation of the pincers and the other element forming the force applying device. A mechanical link between the second element and the pincers controls the opening and closing of the pincers.
FR7345397A 1973-12-18 1973-12-18 Solder testing machine for microcircuits - applies force to component using pincers operated from a tt toooorquemeter Expired FR2254992A5 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR7345397A FR2254992A5 (en) 1973-12-18 1973-12-18 Solder testing machine for microcircuits - applies force to component using pincers operated from a tt toooorquemeter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7345397A FR2254992A5 (en) 1973-12-18 1973-12-18 Solder testing machine for microcircuits - applies force to component using pincers operated from a tt toooorquemeter

Publications (1)

Publication Number Publication Date
FR2254992A5 true FR2254992A5 (en) 1975-07-11

Family

ID=9129416

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7345397A Expired FR2254992A5 (en) 1973-12-18 1973-12-18 Solder testing machine for microcircuits - applies force to component using pincers operated from a tt toooorquemeter

Country Status (1)

Country Link
FR (1) FR2254992A5 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5170669A (en) * 1990-04-11 1992-12-15 Kao Corporation Hair nature measuring instrument

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5170669A (en) * 1990-04-11 1992-12-15 Kao Corporation Hair nature measuring instrument

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Legal Events

Date Code Title Description
ST Notification of lapse