FR2201475B1 - - Google Patents

Info

Publication number
FR2201475B1
FR2201475B1 FR7326968A FR7326968A FR2201475B1 FR 2201475 B1 FR2201475 B1 FR 2201475B1 FR 7326968 A FR7326968 A FR 7326968A FR 7326968 A FR7326968 A FR 7326968A FR 2201475 B1 FR2201475 B1 FR 2201475B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7326968A
Other languages
French (fr)
Other versions
FR2201475A1 (enrdf_load_stackoverflow
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Priority to FR7326968A priority Critical patent/FR2201475B1/fr
Publication of FR2201475A1 publication Critical patent/FR2201475A1/fr
Application granted granted Critical
Publication of FR2201475B1 publication Critical patent/FR2201475B1/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318505—Test of Modular systems, e.g. Wafers, MCM's

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
FR7326968A 1973-07-20 1973-07-20 Expired FR2201475B1 (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR7326968A FR2201475B1 (enrdf_load_stackoverflow) 1973-07-20 1973-07-20

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7326968A FR2201475B1 (enrdf_load_stackoverflow) 1973-07-20 1973-07-20

Publications (2)

Publication Number Publication Date
FR2201475A1 FR2201475A1 (enrdf_load_stackoverflow) 1974-04-26
FR2201475B1 true FR2201475B1 (enrdf_load_stackoverflow) 1978-12-01

Family

ID=9122996

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7326968A Expired FR2201475B1 (enrdf_load_stackoverflow) 1973-07-20 1973-07-20

Country Status (1)

Country Link
FR (1) FR2201475B1 (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3148129A1 (fr) 2023-04-21 2024-10-25 Orange Estimation perfectionnée d’une distance source-microphone et d’une géométrie de salle

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3742254A (en) * 1971-01-27 1973-06-26 Texas Instruments Inc Automatic mos grounding circuit

Also Published As

Publication number Publication date
FR2201475A1 (enrdf_load_stackoverflow) 1974-04-26

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