Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Societe Europeenne de Semi Conducteurs de Microelectronique SA SESCOSEM
Original Assignee
Societe Europeenne de Semi Conducteurs de Microelectronique SA SESCOSEM
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Publication date
Application filed by Societe Europeenne de Semi Conducteurs de Microelectronique SA SESCOSEMfiledCriticalSociete Europeenne de Semi Conducteurs de Microelectronique SA SESCOSEM
Priority to FR7126190ApriorityCriticalpatent/FR2146107B1/fr
Publication of FR2146107A1publicationCriticalpatent/FR2146107A1/fr
Application grantedgrantedCritical
Publication of FR2146107B1publicationCriticalpatent/FR2146107B1/fr
G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
G01R31/26—Testing of individual semiconductor devices
G01R31/2607—Circuits therefor
G01R31/2637—Circuits therefor for testing other individual devices