FR2094024A1 - - Google Patents

Info

Publication number
FR2094024A1
FR2094024A1 FR7115064A FR7115064A FR2094024A1 FR 2094024 A1 FR2094024 A1 FR 2094024A1 FR 7115064 A FR7115064 A FR 7115064A FR 7115064 A FR7115064 A FR 7115064A FR 2094024 A1 FR2094024 A1 FR 2094024A1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7115064A
Other versions
FR2094024B1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of FR2094024A1 publication Critical patent/FR2094024A1/fr
Application granted granted Critical
Publication of FR2094024B1 publication Critical patent/FR2094024B1/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2637—Circuits therefor for testing other individual devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/10—Measuring as part of the manufacturing process
    • H01L22/14—Measuring as part of the manufacturing process for electrical parameters, e.g. resistance, deep-levels, CV, diffusions by electrical means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Bipolar Transistors (AREA)
FR7115064A 1970-06-04 1971-04-20 Expired FR2094024B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19702027459 DE2027459A1 (de) 1970-06-04 1970-06-04 Verfahren zur Kontrolle von Diffusions

Publications (2)

Publication Number Publication Date
FR2094024A1 true FR2094024A1 (fr) 1972-02-04
FR2094024B1 FR2094024B1 (fr) 1974-09-27

Family

ID=5773017

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7115064A Expired FR2094024B1 (fr) 1970-06-04 1971-04-20

Country Status (3)

Country Link
DE (1) DE2027459A1 (fr)
FR (1) FR2094024B1 (fr)
GB (1) GB1283004A (fr)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1544514A (fr) * 1966-11-15 1968-10-31 Westinghouse Electric Corp Thyristor perfectionné

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1544514A (fr) * 1966-11-15 1968-10-31 Westinghouse Electric Corp Thyristor perfectionné

Also Published As

Publication number Publication date
GB1283004A (en) 1972-07-26
DE2027459A1 (de) 1971-12-16
FR2094024B1 (fr) 1974-09-27

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Legal Events

Date Code Title Description
ST Notification of lapse