FR2058756A5 - - Google Patents

Info

Publication number
FR2058756A5
FR2058756A5 FR6932563A FR6932563A FR2058756A5 FR 2058756 A5 FR2058756 A5 FR 2058756A5 FR 6932563 A FR6932563 A FR 6932563A FR 6932563 A FR6932563 A FR 6932563A FR 2058756 A5 FR2058756 A5 FR 2058756A5
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR6932563A
Other languages
French (fr)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to DE19691946931 priority Critical patent/DE1946931A1/en
Application filed by General Electric Co filed Critical General Electric Co
Priority to FR6932563A priority patent/FR2058756A5/fr
Application granted granted Critical
Publication of FR2058756A5 publication Critical patent/FR2058756A5/fr
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/266—Measurement of magnetic- or electric fields in the object; Lorentzmicroscopy
    • H01J37/268—Measurement of magnetic- or electric fields in the object; Lorentzmicroscopy with scanning beams
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/305—Contactless testing using electron beams
FR6932563A 1969-09-17 1969-09-24 Expired FR2058756A5 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
DE19691946931 DE1946931A1 (en) 1969-09-17 1969-09-17 Method for testing circuits and devices for carrying out the method
FR6932563A FR2058756A5 (en) 1969-09-17 1969-09-24

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19691946931 DE1946931A1 (en) 1969-09-17 1969-09-17 Method for testing circuits and devices for carrying out the method
FR6932563A FR2058756A5 (en) 1969-09-17 1969-09-24

Publications (1)

Publication Number Publication Date
FR2058756A5 true FR2058756A5 (en) 1971-05-28

Family

ID=25757908

Family Applications (1)

Application Number Title Priority Date Filing Date
FR6932563A Expired FR2058756A5 (en) 1969-09-17 1969-09-24

Country Status (2)

Country Link
DE (1) DE1946931A1 (en)
FR (1) FR2058756A5 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2380556A1 (en) * 1977-02-11 1978-09-08 Secretary Industry Brit METHOD AND APPARATUS FOR CONTROL OF ELECTRONIC CIRCUITS BY ELECTRON BEAM
WO1984004819A1 (en) * 1983-05-25 1984-12-06 Battelle Memorial Institute Method for inspecting and testing an electric device of the printed or integrated circuit type

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL182924C (en) * 1978-05-12 1988-06-01 Philips Nv DEVICE FOR IMPLANTING IONS IN A TIPPLATE.
DE3110140A1 (en) * 1981-03-16 1982-09-23 Siemens AG, 1000 Berlin und 8000 München DEVICE AND METHOD FOR A RAPID INTERNAL LOGIC CHECK ON INTEGRATED CIRCUITS
DE3138929A1 (en) * 1981-09-30 1983-04-14 Siemens AG, 1000 Berlin und 8000 München IMPROVED SECONDARY ELECTRON SPECTROMETER FOR POTENTIAL MEASUREMENT ON A SAMPLE WITH AN ELECTRON PROBE
DE3232671A1 (en) * 1982-09-02 1984-03-08 Siemens AG, 1000 Berlin und 8000 München ARRANGEMENT AND METHOD FOR MEASURING VOLTAGE ON A CURVED MEASURING OBJECT
DE3235698A1 (en) * 1982-09-27 1984-03-29 Siemens AG, 1000 Berlin und 8000 München DEVICE AND METHOD FOR DIRECTLY MEASURING SIGNAL PROCESSES AT MULTIPLE MEASURING POINTS WITH HIGH TIME RESOLUTION
US5258706A (en) * 1991-10-16 1993-11-02 Siemens Aktiengesellschaft Method for the recognition of testing errors in the test of microwirings

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2380556A1 (en) * 1977-02-11 1978-09-08 Secretary Industry Brit METHOD AND APPARATUS FOR CONTROL OF ELECTRONIC CIRCUITS BY ELECTRON BEAM
WO1984004819A1 (en) * 1983-05-25 1984-12-06 Battelle Memorial Institute Method for inspecting and testing an electric device of the printed or integrated circuit type
EP0129508A1 (en) * 1983-05-25 1984-12-27 Battelle Memorial Institute Examining and testing method of an electric device of the integrated or printed circuit type
US4712057A (en) * 1983-05-25 1987-12-08 Battelle Memorial Institute Method of examining and testing an electric device such as an integrated or printed circuit

Also Published As

Publication number Publication date
DE1946931A1 (en) 1971-03-18

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Legal Events

Date Code Title Description
ST Notification of lapse