FR2040282A1 - - Google Patents
Info
- Publication number
- FR2040282A1 FR2040282A1 FR7014534A FR7014534A FR2040282A1 FR 2040282 A1 FR2040282 A1 FR 2040282A1 FR 7014534 A FR7014534 A FR 7014534A FR 7014534 A FR7014534 A FR 7014534A FR 2040282 A1 FR2040282 A1 FR 2040282A1
- Authority
- FR
- France
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/285—Emission microscopes, e.g. field-emission microscopes
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Microscoopes, Condenser (AREA)
- Electron Sources, Ion Sources (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CH665969A CH493934A (en) | 1969-04-28 | 1969-04-28 | Electron emission microscope |
Publications (1)
Publication Number | Publication Date |
---|---|
FR2040282A1 true FR2040282A1 (en) | 1971-01-22 |
Family
ID=4313018
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7014534A Withdrawn FR2040282A1 (en) | 1969-04-28 | 1970-04-22 |
Country Status (5)
Country | Link |
---|---|
CH (1) | CH493934A (en) |
DE (1) | DE2009005C3 (en) |
FR (1) | FR2040282A1 (en) |
GB (1) | GB1279049A (en) |
NL (1) | NL143728B (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5963453B2 (en) | 2011-03-15 | 2016-08-03 | 株式会社荏原製作所 | Inspection device |
US10989679B2 (en) * | 2017-02-28 | 2021-04-27 | Tokyo Institute Of Technology | Time-resolved photoemission electron microscopy and method for imaging carrier dynamics using the technique |
-
1969
- 1969-04-28 CH CH665969A patent/CH493934A/en not_active IP Right Cessation
- 1969-06-12 NL NL6908987A patent/NL143728B/en unknown
-
1970
- 1970-02-26 DE DE19702009005 patent/DE2009005C3/en not_active Expired
- 1970-03-24 GB GB1435670A patent/GB1279049A/en not_active Expired
- 1970-04-22 FR FR7014534A patent/FR2040282A1/fr not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
CH493934A (en) | 1970-07-15 |
DE2009005B2 (en) | 1978-08-31 |
NL143728B (en) | 1974-10-15 |
GB1279049A (en) | 1972-06-21 |
DE2009005C3 (en) | 1979-05-03 |
DE2009005A1 (en) | 1970-10-29 |
NL6908987A (en) | 1970-10-30 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |