FR1516884A - Method and device for checking and detecting material defects and their various applications - Google Patents

Method and device for checking and detecting material defects and their various applications

Info

Publication number
FR1516884A
FR1516884A FR89124A FR89124A FR1516884A FR 1516884 A FR1516884 A FR 1516884A FR 89124 A FR89124 A FR 89124A FR 89124 A FR89124 A FR 89124A FR 1516884 A FR1516884 A FR 1516884A
Authority
FR
France
Prior art keywords
checking
various applications
detecting material
material defects
defects
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR89124A
Other languages
French (fr)
Inventor
Jean-Claude Raymond Hugues
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
PRODUCTION ET D APPLIC DE NOUV
Original Assignee
PRODUCTION ET D APPLIC DE NOUV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to FR837236A priority Critical patent/FR503M/fr
Application filed by PRODUCTION ET D APPLIC DE NOUV filed Critical PRODUCTION ET D APPLIC DE NOUV
Priority to FR89124A priority patent/FR1516884A/en
Application granted granted Critical
Publication of FR1516884A publication Critical patent/FR1516884A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/91—Investigating the presence of flaws or contamination using penetration of dyes, e.g. fluorescent ink
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61K—PREPARATIONS FOR MEDICAL, DENTAL OR TOILETRY PURPOSES
    • A61K31/00—Medicinal preparations containing organic active ingredients
    • A61K31/16—Amides, e.g. hydroxamic acids
    • A61K31/165—Amides, e.g. hydroxamic acids having aromatic rings, e.g. colchicine, atenolol, progabide
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61K—PREPARATIONS FOR MEDICAL, DENTAL OR TOILETRY PURPOSES
    • A61K31/00—Medicinal preparations containing organic active ingredients
    • A61K31/33—Heterocyclic compounds
    • A61K31/395—Heterocyclic compounds having nitrogen as a ring hetero atom, e.g. guanethidine or rifamycins
    • A61K31/495—Heterocyclic compounds having nitrogen as a ring hetero atom, e.g. guanethidine or rifamycins having six-membered rings with two or more nitrogen atoms as the only ring heteroatoms, e.g. piperazine or tetrazines
    • A61K31/505—Pyrimidines; Hydrogenated pyrimidines, e.g. trimethoprim
    • A61K31/513—Pyrimidines; Hydrogenated pyrimidines, e.g. trimethoprim having oxo groups directly attached to the heterocyclic ring, e.g. cytosine
    • A61K31/515—Barbituric acids; Derivatives thereof, e.g. sodium pentobarbital

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Medicinal Chemistry (AREA)
  • Veterinary Medicine (AREA)
  • Public Health (AREA)
  • Animal Behavior & Ethology (AREA)
  • Epidemiology (AREA)
  • Pharmacology & Pharmacy (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
FR89124A 1960-08-30 1966-12-28 Method and device for checking and detecting material defects and their various applications Expired FR1516884A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR837236A FR503M (en) 1960-08-30 1960-08-30
FR89124A FR1516884A (en) 1966-12-28 1966-12-28 Method and device for checking and detecting material defects and their various applications

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR89124A FR1516884A (en) 1966-12-28 1966-12-28 Method and device for checking and detecting material defects and their various applications

Publications (1)

Publication Number Publication Date
FR1516884A true FR1516884A (en) 1968-02-05

Family

ID=8623059

Family Applications (2)

Application Number Title Priority Date Filing Date
FR837236A Active FR503M (en) 1960-08-30 1960-08-30
FR89124A Expired FR1516884A (en) 1960-08-30 1966-12-28 Method and device for checking and detecting material defects and their various applications

Family Applications Before (1)

Application Number Title Priority Date Filing Date
FR837236A Active FR503M (en) 1960-08-30 1960-08-30

Country Status (1)

Country Link
FR (2) FR503M (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004132951A (en) * 2002-06-07 2004-04-30 Interuniv Micro Electronica Centrum Vzw Method for wafer level detection as to integrity of layer
US7016028B2 (en) 2002-06-07 2006-03-21 Interuniversitair Microelektronica Centrum (Imec) Method and apparatus for defect detection
CN114414577A (en) * 2021-12-24 2022-04-29 华南理工大学 Method and system for detecting plastic product based on terahertz technology

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004132951A (en) * 2002-06-07 2004-04-30 Interuniv Micro Electronica Centrum Vzw Method for wafer level detection as to integrity of layer
EP1369682A3 (en) * 2002-06-07 2004-12-01 Interuniversitair Microelektronica Centrum Vzw A method for wafer level detection of integrity of a layer
US7016028B2 (en) 2002-06-07 2006-03-21 Interuniversitair Microelektronica Centrum (Imec) Method and apparatus for defect detection
CN114414577A (en) * 2021-12-24 2022-04-29 华南理工大学 Method and system for detecting plastic product based on terahertz technology
CN114414577B (en) * 2021-12-24 2023-12-22 华南理工大学 Method and system for detecting plastic products based on terahertz technology

Also Published As

Publication number Publication date
FR503M (en) 1961-05-15

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