FR1500772A - Diffraction goniometer, particularly rontgen goniometer - Google Patents

Diffraction goniometer, particularly rontgen goniometer

Info

Publication number
FR1500772A
FR1500772A FR18071A FR18071A FR1500772A FR 1500772 A FR1500772 A FR 1500772A FR 18071 A FR18071 A FR 18071A FR 18071 A FR18071 A FR 18071A FR 1500772 A FR1500772 A FR 1500772A
Authority
FR
France
Prior art keywords
goniometer
rontgen
diffraction
diffraction goniometer
rontgen goniometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR18071A
Other languages
French (fr)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Chirana Praha np
Original Assignee
Chirana Praha np
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chirana Praha np filed Critical Chirana Praha np
Application granted granted Critical
Publication of FR1500772A publication Critical patent/FR1500772A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR18071A 1964-05-23 1965-05-22 Diffraction goniometer, particularly rontgen goniometer Expired FR1500772A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CS298264 1964-05-23

Publications (1)

Publication Number Publication Date
FR1500772A true FR1500772A (en) 1967-11-10

Family

ID=5368585

Family Applications (1)

Application Number Title Priority Date Filing Date
FR18071A Expired FR1500772A (en) 1964-05-23 1965-05-22 Diffraction goniometer, particularly rontgen goniometer

Country Status (4)

Country Link
DE (1) DE1245164B (en)
FR (1) FR1500772A (en)
GB (1) GB1089975A (en)
NL (1) NL6506536A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0497406A1 (en) * 1991-01-31 1992-08-05 Philips Patentverwaltung GmbH Radiographic device for measuring stress

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3379075D1 (en) * 1983-10-12 1989-03-02 Philips Nv X-ray examination apparatus

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2805341A (en) * 1954-07-12 1957-09-03 Andrew R Lang Diffractometer
GB847265A (en) * 1957-09-11 1960-09-07 Ass Elect Ind Improvements relating to mechanical linkages
NL244115A (en) * 1958-10-07

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0497406A1 (en) * 1991-01-31 1992-08-05 Philips Patentverwaltung GmbH Radiographic device for measuring stress

Also Published As

Publication number Publication date
NL6506536A (en) 1965-11-24
GB1089975A (en) 1967-11-08
DE1245164B (en) 1967-07-20

Similar Documents

Publication Publication Date Title
FI45136C (en) Application cartridge for industrial powder-powered instruments.
NL144087B (en) ION SOURCE.
FR1440594A (en) Reduction transmission mechanism
OA02254A (en) Variable reluctance deceleration detector.
FR1500772A (en) Diffraction goniometer, particularly rontgen goniometer
FR1424016A (en) Irradiated polyethylene-based compositions
FR1403110A (en) Brake door closer
FR1432433A (en) Monochromator
FR1428786A (en) Screws, especially screws to drill the sheet metal
FR1427910A (en) Rotary slicer
FR1417790A (en) Tool box
FR1413773A (en) Jaw crusher
FR1407144A (en) Hand seeder
FR1459609A (en) Advanced Combat Vehicle Management
FR1427145A (en) Crimping machine
FR1399450A (en) Radar improvements
FR1417871A (en) Counter-hammer forging hammer
FR1391862A (en) Notch lock
FR1397052A (en) Upsetting machine
FR1438630A (en) Counter-pressure filler
FR1425475A (en) Electroplating improvements
FR1396818A (en) Rotary drum shears
FR1409471A (en) Rotary system box
FR1459317A (en) Hand brake box
FR1401270A (en) Advanced positive information detector