FR1499918A - Dispositif d'analyse différentielle en fluorescence chi - Google Patents

Dispositif d'analyse différentielle en fluorescence chi

Info

Publication number
FR1499918A
FR1499918A FR54908A FR54908A FR1499918A FR 1499918 A FR1499918 A FR 1499918A FR 54908 A FR54908 A FR 54908A FR 54908 A FR54908 A FR 54908A FR 1499918 A FR1499918 A FR 1499918A
Authority
FR
France
Prior art keywords
analysis device
differential analysis
fluorescence differential
chi
chi fluorescence
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR54908A
Other languages
English (en)
Inventor
Claude Campo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Esso SA
Original Assignee
Esso Standard SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Esso Standard SA filed Critical Esso Standard SA
Priority to FR54908A priority Critical patent/FR1499918A/fr
Application granted granted Critical
Publication of FR1499918A publication Critical patent/FR1499918A/fr
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
FR54908A 1966-03-24 1966-03-24 Dispositif d'analyse différentielle en fluorescence chi Expired FR1499918A (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR54908A FR1499918A (fr) 1966-03-24 1966-03-24 Dispositif d'analyse différentielle en fluorescence chi

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR54908A FR1499918A (fr) 1966-03-24 1966-03-24 Dispositif d'analyse différentielle en fluorescence chi

Publications (1)

Publication Number Publication Date
FR1499918A true FR1499918A (fr) 1967-11-03

Family

ID=8604629

Family Applications (1)

Application Number Title Priority Date Filing Date
FR54908A Expired FR1499918A (fr) 1966-03-24 1966-03-24 Dispositif d'analyse différentielle en fluorescence chi

Country Status (1)

Country Link
FR (1) FR1499918A (fr)

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