FR1430993A - Procédé de préparation d'un échantillon rocheux destiné à l'analyse diffractométrique et dispositif permettant la réalisation du procédé - Google Patents

Procédé de préparation d'un échantillon rocheux destiné à l'analyse diffractométrique et dispositif permettant la réalisation du procédé

Info

Publication number
FR1430993A
FR1430993A FR3122A FR3122A FR1430993A FR 1430993 A FR1430993 A FR 1430993A FR 3122 A FR3122 A FR 3122A FR 3122 A FR3122 A FR 3122A FR 1430993 A FR1430993 A FR 1430993A
Authority
FR
France
Prior art keywords
preparing
carrying
rock sample
sample intended
diffractometric analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR3122A
Other languages
English (en)
French (fr)
Inventor
Georges Kulbicki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Societe Nationale des Petroles dAquitaine SA
Original Assignee
Societe Nationale des Petroles dAquitaine SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Societe Nationale des Petroles dAquitaine SA filed Critical Societe Nationale des Petroles dAquitaine SA
Priority to FR3122A priority Critical patent/FR1430993A/fr
Priority to DK187865A priority patent/DK114259B/da
Priority to BE674720D priority patent/BE674720A/xx
Priority to LU50206A priority patent/LU50206A1/xx
Priority to NL6600865A priority patent/NL6600865A/xx
Application granted granted Critical
Publication of FR1430993A publication Critical patent/FR1430993A/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/24—Earth materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/056—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/307—Accessories, mechanical or electrical features cuvettes-sample holders

Landscapes

  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geology (AREA)
  • Remote Sensing (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
FR3122A 1965-01-25 1965-01-25 Procédé de préparation d'un échantillon rocheux destiné à l'analyse diffractométrique et dispositif permettant la réalisation du procédé Expired FR1430993A (fr)

Priority Applications (5)

Application Number Priority Date Filing Date Title
FR3122A FR1430993A (fr) 1965-01-25 1965-01-25 Procédé de préparation d'un échantillon rocheux destiné à l'analyse diffractométrique et dispositif permettant la réalisation du procédé
DK187865A DK114259B (da) 1965-01-25 1965-04-13 Forstøvningsapparat.
BE674720D BE674720A (forum.php) 1965-01-25 1966-01-04
LU50206A LU50206A1 (forum.php) 1965-01-25 1966-01-06
NL6600865A NL6600865A (forum.php) 1965-01-25 1966-01-24

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR3122A FR1430993A (fr) 1965-01-25 1965-01-25 Procédé de préparation d'un échantillon rocheux destiné à l'analyse diffractométrique et dispositif permettant la réalisation du procédé

Publications (1)

Publication Number Publication Date
FR1430993A true FR1430993A (fr) 1966-03-11

Family

ID=8569111

Family Applications (1)

Application Number Title Priority Date Filing Date
FR3122A Expired FR1430993A (fr) 1965-01-25 1965-01-25 Procédé de préparation d'un échantillon rocheux destiné à l'analyse diffractométrique et dispositif permettant la réalisation du procédé

Country Status (5)

Country Link
BE (1) BE674720A (forum.php)
DK (1) DK114259B (forum.php)
FR (1) FR1430993A (forum.php)
LU (1) LU50206A1 (forum.php)
NL (1) NL6600865A (forum.php)

Also Published As

Publication number Publication date
DK114259B (da) 1969-06-09
LU50206A1 (forum.php) 1966-03-07
NL6600865A (forum.php) 1966-07-26
BE674720A (forum.php) 1966-05-03

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