Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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American Electronic Laboratories Inc
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American Electronic Laboratories Inc
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Application filed by American Electronic Laboratories IncfiledCriticalAmerican Electronic Laboratories Inc
Priority to FR995121ApriorityCriticalpatent/FR1420624A/fr
Application grantedgrantedCritical
Publication of FR1420624ApublicationCriticalpatent/FR1420624A/fr
G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
G01R31/26—Testing of individual semiconductor devices
G01R31/2607—Circuits therefor
G01R31/2608—Circuits therefor for testing bipolar transistors
G01R31/2614—Circuits therefor for testing bipolar transistors for measuring gain factor thereof
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Engineering & Computer Science
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Microelectronics & Electronic Packaging
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Physics & Mathematics
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General Physics & Mathematics
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FR995121A1964-11-161964-11-16Procédé et appareil pour mesurer le paramètre bêta d'un transistor
ExpiredFR1420624A
(fr)