FR1407462A - Method for measuring the thickness of a coating on a metal base - Google Patents
Method for measuring the thickness of a coating on a metal baseInfo
- Publication number
- FR1407462A FR1407462A FR987696A FR987696A FR1407462A FR 1407462 A FR1407462 A FR 1407462A FR 987696 A FR987696 A FR 987696A FR 987696 A FR987696 A FR 987696A FR 1407462 A FR1407462 A FR 1407462A
- Authority
- FR
- France
- Prior art keywords
- coating
- measuring
- thickness
- metal base
- metal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/16—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a moving sheet or film
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR987696A FR1407462A (en) | 1963-09-10 | 1964-09-10 | Method for measuring the thickness of a coating on a metal base |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US30785363A | 1963-09-10 | 1963-09-10 | |
FR987696A FR1407462A (en) | 1963-09-10 | 1964-09-10 | Method for measuring the thickness of a coating on a metal base |
Publications (1)
Publication Number | Publication Date |
---|---|
FR1407462A true FR1407462A (en) | 1965-07-30 |
Family
ID=26209897
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR987696A Expired FR1407462A (en) | 1963-09-10 | 1964-09-10 | Method for measuring the thickness of a coating on a metal base |
Country Status (1)
Country | Link |
---|---|
FR (1) | FR1407462A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2321124A1 (en) * | 1975-08-12 | 1977-03-11 | Nisshin Steel Co Ltd | METHOD FOR MEASURING THE DEGREE OF ALLOY OF GALVANIZED STEEL SHEETS |
-
1964
- 1964-09-10 FR FR987696A patent/FR1407462A/en not_active Expired
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2321124A1 (en) * | 1975-08-12 | 1977-03-11 | Nisshin Steel Co Ltd | METHOD FOR MEASURING THE DEGREE OF ALLOY OF GALVANIZED STEEL SHEETS |
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