FR1398091A - Improvements to chi fluorescence assay devices - Google Patents

Improvements to chi fluorescence assay devices

Info

Publication number
FR1398091A
FR1398091A FR968761A FR968761A FR1398091A FR 1398091 A FR1398091 A FR 1398091A FR 968761 A FR968761 A FR 968761A FR 968761 A FR968761 A FR 968761A FR 1398091 A FR1398091 A FR 1398091A
Authority
FR
France
Prior art keywords
fluorescence assay
assay devices
chi
chi fluorescence
devices
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR968761A
Other languages
French (fr)
Inventor
Jean-Claude Delarue
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Compagnie Generale de Radiologie SA
Original Assignee
Compagnie Generale de Radiologie SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Compagnie Generale de Radiologie SA filed Critical Compagnie Generale de Radiologie SA
Priority to FR968761A priority Critical patent/FR1398091A/en
Priority to GB12782/65A priority patent/GB1093885A/en
Priority to US442634A priority patent/US3391276A/en
Application granted granted Critical
Publication of FR1398091A publication Critical patent/FR1398091A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/2204—Specimen supports therefor; Sample conveying means therefore
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Dispersion Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR968761A 1964-03-26 1964-03-26 Improvements to chi fluorescence assay devices Expired FR1398091A (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
FR968761A FR1398091A (en) 1964-03-26 1964-03-26 Improvements to chi fluorescence assay devices
GB12782/65A GB1093885A (en) 1964-03-26 1965-03-25 Method and apparatus for x-ray analysis
US442634A US3391276A (en) 1964-03-26 1965-03-25 Apparatus for X-ray analysis having automatic cycling means

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR968761A FR1398091A (en) 1964-03-26 1964-03-26 Improvements to chi fluorescence assay devices

Publications (1)

Publication Number Publication Date
FR1398091A true FR1398091A (en) 1965-05-07

Family

ID=8826408

Family Applications (1)

Application Number Title Priority Date Filing Date
FR968761A Expired FR1398091A (en) 1964-03-26 1964-03-26 Improvements to chi fluorescence assay devices

Country Status (3)

Country Link
US (1) US3391276A (en)
FR (1) FR1398091A (en)
GB (1) GB1093885A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109490934A (en) * 2018-12-19 2019-03-19 上海平高天灵开关有限公司 A kind of vacuum interrupter X-ray detection platform

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3483551A (en) * 1966-04-26 1969-12-09 American Cyanamid Co Electrical circuitry
US3654460A (en) * 1969-02-12 1972-04-04 Continental Oil Co Automatic sample changer for a goniometer with means to accomodate samples of different thicknesses
DE2146774C3 (en) * 1971-09-20 1975-12-04 Gesellschaft Fuer Kernforschung Mbh, 7500 Karlsruhe Device for the determination of concentrations of fissile and / or fertile substances by means of X-ray fluorescence spectrometry
US3920984A (en) * 1974-04-08 1975-11-18 Machlett Lab Inc X-ray energy analyzer
US3919548A (en) * 1974-07-24 1975-11-11 David E Porter X-Ray energy spectrometer system
DE2632001C3 (en) * 1976-07-16 1980-10-23 Gkss - Forschungszentrum Geesthacht Gmbh, 2000 Hamburg Measurement arrangement for X-ray fluorescence analysis
US4151418A (en) * 1977-08-17 1979-04-24 Bausch & Lomb, Inc. Multiple crystal holder assembly for wavelength dispersive X-ray spectrometers
DE19820321B4 (en) * 1998-05-07 2004-09-16 Bruker Axs Gmbh Compact x-ray spectrometer
US8256957B1 (en) * 2009-09-29 2012-09-04 X-Ray Imaging Innovations, LLC Bi-directional mobile radiographic image receptor assembly and use thereof
DE102012021484B3 (en) * 2012-11-05 2013-10-17 Franz Brenk Gmbh & Co. Kg Calibration standard for use in X-ray fluorescence analyzer, has sample holder that is set for executing calibration in rotation around axis, so that calibration sample is passed-over from measuring spot during calibration of elements
DE102022119877A1 (en) 2022-08-08 2024-02-08 Helmut Fischer GmbH Institut für Elektronik und Messtechnik Calibration device for a measuring device and method for calibrating a measuring device

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3102952A (en) * 1954-05-27 1963-09-03 Philips Corp X-ray fluorescence analysis of multi-component systems
US3146347A (en) * 1961-08-25 1964-08-25 Lab For Electronics Inc Apparatus for analyzing material by excited x-rays
US3177360A (en) * 1962-09-14 1965-04-06 Norton Co Diffractometer with a rotatable support to hold plural samples for automatic analysis of crystalline material
US3263078A (en) * 1964-05-18 1966-07-26 Nat Lead Co Automatic sample changer for x-ray diffractometer

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109490934A (en) * 2018-12-19 2019-03-19 上海平高天灵开关有限公司 A kind of vacuum interrupter X-ray detection platform
CN109490934B (en) * 2018-12-19 2022-11-25 上海平高天灵开关有限公司 X-ray detection platform for vacuum arc-extinguishing chamber

Also Published As

Publication number Publication date
US3391276A (en) 1968-07-02
GB1093885A (en) 1967-12-06

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