FR1344877A - Device for measuring thickness using radioactive isotopes or chi rays - Google Patents

Device for measuring thickness using radioactive isotopes or chi rays

Info

Publication number
FR1344877A
FR1344877A FR888358A FR888358A FR1344877A FR 1344877 A FR1344877 A FR 1344877A FR 888358 A FR888358 A FR 888358A FR 888358 A FR888358 A FR 888358A FR 1344877 A FR1344877 A FR 1344877A
Authority
FR
France
Prior art keywords
chi
rays
radioactive isotopes
measuring thickness
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR888358A
Other languages
French (fr)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Vakutronik VEB
Original Assignee
Vakutronik VEB
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Vakutronik VEB filed Critical Vakutronik VEB
Priority to FR888358A priority Critical patent/FR1344877A/en
Application granted granted Critical
Publication of FR1344877A publication Critical patent/FR1344877A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01G—WEIGHING
    • G01G9/00—Methods of, or apparatus for, the determination of weight, not provided for in groups G01G1/00 - G01G7/00
    • G01G9/005—Methods of, or apparatus for, the determination of weight, not provided for in groups G01G1/00 - G01G7/00 using radiations, e.g. radioactive
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays

Landscapes

  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
FR888358A 1962-02-16 1962-02-16 Device for measuring thickness using radioactive isotopes or chi rays Expired FR1344877A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR888358A FR1344877A (en) 1962-02-16 1962-02-16 Device for measuring thickness using radioactive isotopes or chi rays

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR888358A FR1344877A (en) 1962-02-16 1962-02-16 Device for measuring thickness using radioactive isotopes or chi rays

Publications (1)

Publication Number Publication Date
FR1344877A true FR1344877A (en) 1963-12-06

Family

ID=8772916

Family Applications (1)

Application Number Title Priority Date Filing Date
FR888358A Expired FR1344877A (en) 1962-02-16 1962-02-16 Device for measuring thickness using radioactive isotopes or chi rays

Country Status (1)

Country Link
FR (1) FR1344877A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1221805B (en) * 1964-01-13 1966-07-28 Vakutronik Dresden Wissenschaf Arrangement for non-contact, continuous layer thickness measurement

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1221805B (en) * 1964-01-13 1966-07-28 Vakutronik Dresden Wissenschaf Arrangement for non-contact, continuous layer thickness measurement

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