Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NVfiledCriticalPhilips Gloeilampenfabrieken NV
Priority to FR921590ApriorityCriticalpatent/FR1344700A/fr
Application grantedgrantedCritical
Publication of FR1344700ApublicationCriticalpatent/FR1344700A/fr
G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
G01R31/26—Testing of individual semiconductor devices
G01R31/2607—Circuits therefor
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Physics & Mathematics
(AREA)
General Physics & Mathematics
(AREA)
FR921590A1963-01-161963-01-16Procédé et dispositif pour l'examen de corps semi-conducteurs
ExpiredFR1344700A
(fr)