FR1209546A - Appareil de mesure de la tension de perçage d'un transistor - Google Patents

Appareil de mesure de la tension de perçage d'un transistor

Info

Publication number
FR1209546A
FR1209546A FR1209546DA FR1209546A FR 1209546 A FR1209546 A FR 1209546A FR 1209546D A FR1209546D A FR 1209546DA FR 1209546 A FR1209546 A FR 1209546A
Authority
FR
France
Prior art keywords
transistor
measuring
piercing
voltage
piercing voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
Other languages
English (en)
Inventor
Russell D Kehler
Alvin R Topfer
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Space Systems Loral LLC
Original Assignee
Philco Ford Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philco Ford Corp filed Critical Philco Ford Corp
Application granted granted Critical
Publication of FR1209546A publication Critical patent/FR1209546A/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2608—Circuits therefor for testing bipolar transistors
    • G01R31/261—Circuits therefor for testing bipolar transistors for measuring break-down voltage or punch through voltage therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
FR1209546D 1957-08-21 1958-08-13 Appareil de mesure de la tension de perçage d'un transistor Expired FR1209546A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US679336A US2906958A (en) 1957-08-21 1957-08-21 Improved apparatus for measuring punchthrough voltage or a related quantity

Publications (1)

Publication Number Publication Date
FR1209546A true FR1209546A (fr) 1960-03-02

Family

ID=24726508

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1209546D Expired FR1209546A (fr) 1957-08-21 1958-08-13 Appareil de mesure de la tension de perçage d'un transistor

Country Status (5)

Country Link
US (1) US2906958A (fr)
DE (1) DE1158180B (fr)
FR (1) FR1209546A (fr)
GB (1) GB860501A (fr)
NL (1) NL109363C (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3173020A (en) * 1960-06-23 1965-03-09 Robert B Seeds Devices for producing voltage pulses

Also Published As

Publication number Publication date
DE1158180B (de) 1963-11-28
GB860501A (en) 1961-02-08
NL109363C (fr) 1964-04-15
US2906958A (en) 1959-09-29

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