FR1185209A - Chi-ray diffractograph for taking diagrams at very high temperature - Google Patents

Chi-ray diffractograph for taking diagrams at very high temperature

Info

Publication number
FR1185209A
FR1185209A FR1185209DA FR1185209A FR 1185209 A FR1185209 A FR 1185209A FR 1185209D A FR1185209D A FR 1185209DA FR 1185209 A FR1185209 A FR 1185209A
Authority
FR
France
Prior art keywords
chi
diagrams
taking
high temperature
diffractograph
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
Other languages
French (fr)
Inventor
F Fournier
A Rimsky
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre National de la Recherche Scientifique CNRS
Original Assignee
Centre National de la Recherche Scientifique CNRS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre National de la Recherche Scientifique CNRS filed Critical Centre National de la Recherche Scientifique CNRS
Application granted granted Critical
Publication of FR1185209A publication Critical patent/FR1185209A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025Sample holders or supports therefor
    • G01N23/20033Sample holders or supports therefor provided with temperature control or heating means
FR1185209D 1957-10-26 1957-10-26 Chi-ray diffractograph for taking diagrams at very high temperature Expired FR1185209A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR1185209T 1957-10-26

Publications (1)

Publication Number Publication Date
FR1185209A true FR1185209A (en) 1959-07-31

Family

ID=9663823

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1185209D Expired FR1185209A (en) 1957-10-26 1957-10-26 Chi-ray diffractograph for taking diagrams at very high temperature

Country Status (1)

Country Link
FR (1) FR1185209A (en)

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