FI935788A0 - Foerfarande foer kalibrering av en gasanalysator - Google Patents

Foerfarande foer kalibrering av en gasanalysator

Info

Publication number
FI935788A0
FI935788A0 FI935788A FI935788A FI935788A0 FI 935788 A0 FI935788 A0 FI 935788A0 FI 935788 A FI935788 A FI 935788A FI 935788 A FI935788 A FI 935788A FI 935788 A0 FI935788 A0 FI 935788A0
Authority
FI
Finland
Prior art keywords
calibration
gas analyzer
foerfarande foer
foerfarande
foer
Prior art date
Application number
FI935788A
Other languages
English (en)
Inventor
Boerje Tor Rantala
Kurt Peter Magnus Weckstroem
Timo Pekka Merilaeinen
Kai Erik Karlsson
Original Assignee
Instrumentarium Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Instrumentarium Oy filed Critical Instrumentarium Oy
Priority to FI935788A priority Critical patent/FI935788A0/fi
Publication of FI935788A0 publication Critical patent/FI935788A0/fi
Priority to US08/360,258 priority patent/US5608212A/en
Priority to FI946017A priority patent/FI946017A/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/59—Transmissivity
    • G01N21/61—Non-dispersive gas analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/127—Calibration; base line adjustment; drift compensation
    • G01N2201/12715—Zero adjustment, i.e. to verify calibration

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
FI935788A 1993-12-22 1993-12-22 Foerfarande foer kalibrering av en gasanalysator FI935788A0 (fi)

Priority Applications (3)

Application Number Priority Date Filing Date Title
FI935788A FI935788A0 (fi) 1993-12-22 1993-12-22 Foerfarande foer kalibrering av en gasanalysator
US08/360,258 US5608212A (en) 1993-12-22 1994-12-20 Method for calibrating the zero point in a gas analyzer
FI946017A FI946017A (fi) 1993-12-22 1994-12-21 Menetelmä kaasuanalysaattorin nollapisteen kalibroimiseksi

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI935788A FI935788A0 (fi) 1993-12-22 1993-12-22 Foerfarande foer kalibrering av en gasanalysator

Publications (1)

Publication Number Publication Date
FI935788A0 true FI935788A0 (fi) 1993-12-22

Family

ID=8539165

Family Applications (1)

Application Number Title Priority Date Filing Date
FI935788A FI935788A0 (fi) 1993-12-22 1993-12-22 Foerfarande foer kalibrering av en gasanalysator

Country Status (2)

Country Link
US (1) US5608212A (fi)
FI (1) FI935788A0 (fi)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3234751B2 (ja) * 1995-07-01 2001-12-04 株式会社堀場製作所 分析装置における校正不能警告方法
KR100556503B1 (ko) * 2002-11-26 2006-03-03 엘지전자 주식회사 건조기의 건조 시간제어 방법
EP3179233B1 (en) * 2014-08-04 2019-10-23 Murata Manufacturing Co., Ltd. Gas density detection device and gas density calculation method for gas density detection device

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4153837A (en) * 1978-02-16 1979-05-08 Anarad, Inc. Optical gas analyzer
US4398091A (en) * 1981-08-24 1983-08-09 Andros Analyzers Incorporated Temperature compensated gas analyzer
US4480191A (en) * 1982-09-27 1984-10-30 Sun Electric Corporation Automatic gain control for an infrared source of an automotive emissions analyzer
US4692621A (en) * 1985-10-11 1987-09-08 Andros Anlayzers Incorporated Digital anesthetic agent analyzer
US4687934A (en) * 1986-01-10 1987-08-18 Andros Analyzers Incorporated Infrared gas analyzer with automatic zero adjustment
US4918311A (en) * 1988-04-15 1990-04-17 Andros Analyzers Incorporated Set point control circuit for an infrared gas analyzer
US5231591A (en) * 1989-09-11 1993-07-27 Nellcor Incorporated Agent gas analyzer and method of use

Also Published As

Publication number Publication date
US5608212A (en) 1997-03-04

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Legal Events

Date Code Title Description
FD Application lapsed